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Studies on Dielectric Properties of Silicon Nitride at High Temperature 被引量:1
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作者 Ting Zhang Shu-Ren Zhang +3 位作者 Meng-Qiang Wu wei-jun sang Zheng-Ping Gao Zhong-Ping Li 《Journal of Electronic Science and Technology of China》 2007年第4期316-319,共4页
In this paper, the dielectric properties of silicon nitride are studied using the dielectric polarization theories. According to the developed dielectric models, the temperature dependence of dielectric constant and l... In this paper, the dielectric properties of silicon nitride are studied using the dielectric polarization theories. According to the developed dielectric models, the temperature dependence of dielectric constant and loss of silicon nitride is mainly analyzed. In addition, the impact of Li^+, K^+, Ca^2+, Al^3+ and Mg^2+ doping on the dielectric properties of silicon nitride are also estimated. 展开更多
关键词 Dielectric properties impurity ion silicon nitride.
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