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1
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Investigation of charge carrier depletion in freestanding nanowires by a multi-probe scanning tunneling microscope |
Andreas Nagelein
Matthias Steidl
Stefan Korte
Bert Voigtlande
wemer prost
Peter Kleinschmidt
Thomas Hannappel
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《Nano Research》
SCIE
EI
CAS
CSCD
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2018 |
0 |
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