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Applications for Nanoscale X-ray Imaging at High Pressure 被引量:1
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作者 wendy l. mao Yu lin +1 位作者 Yijin liu Jin liu 《Engineering》 SCIE EI 2019年第3期479-489,共11页
Coupling nanoscale transmission X-ray microscopy (nanoTXM) with a diamond anvil cell (DAC) has exciting potential as a powerful three-dimensional probe for non-destructive imaging at high spatial resolution of materia... Coupling nanoscale transmission X-ray microscopy (nanoTXM) with a diamond anvil cell (DAC) has exciting potential as a powerful three-dimensional probe for non-destructive imaging at high spatial resolution of materials under extreme conditions. In this article, we discuss current developments in high-resolution X-ray imaging and its application in high-pressure nanoTXM experiments in a DAC with third-generation synchrotron X-ray sources, including technical considerations for preparing successful measurements. We then present results from a number of recent in situ high-pressure measurements investigating equations of state (EOS) in amorphous or poorly crystalline materials and in pressureinduced phase transitions and electronic changes. These results illustrate the potential this technique holds for addressing a wide range of research areas, ranging from condensed matter physics and solidstate chemistry to materials science and planetary interiors. Future directions for this exciting technique and opportunities to improve its capabilities for broader application in high-pressure science are discussed. 展开更多
关键词 X-RAY imaging High PRESSURE DIAMOND ANVIL cell
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