期刊文献+
共找到1篇文章
< 1 >
每页显示 20 50 100
Erratum to “Accurate determination of film thickness by low-angle x-ray reflection”
1
作者 Ming Xu Tao Yang +5 位作者 wenxue yu Ning Yang Cuixiu Liu Zhenhong Mai Wuyan Lai Kun Tao 《Chinese Physics B》 SCIE EI CAS CSCD 2022年第9期658-658,共1页
Equation(6)in Chin.Phys.090833(2000)is corrected.All subsequent derivations were given based on the correct Eq.(6),so the conclusions in the paper are not ffected by the rrata.
关键词 erratum film thickness X-RAY
下载PDF
上一页 1 下一页 到第
使用帮助 返回顶部