High-throughput scanning electron microscopy(SEM)coupled with classification using neural networks is an ideal method to determine the morphological handedness of large populations of chiral nanoparticles.Automated la...High-throughput scanning electron microscopy(SEM)coupled with classification using neural networks is an ideal method to determine the morphological handedness of large populations of chiral nanoparticles.Automated labeling removes the time-consuming manual labeling of training data,but introduces label error,and subsequently classification error in the trained neural network.Here,we evaluate methods to minimize classification error when training from automated labels of SEM datasets of chiral Tellurium nanoparticles.Using the mirror relationship between images of opposite handed particles,we artificially create populations of varying label error.We analyze the impact of label error rate and training method on the classification error of neural networks on an ideal dataset and on a practical dataset.Of the three training methods considered,we find that a pretraining approach yields the most accurate results across label error rates on ideal datasets,where size and other morphological variables are held constant,but that a co-teaching approach performs the best in practical application.展开更多
基金supported by the National Key Research and Development Project(2022YFA1503900,2022YFA1503000,and 2022YFA1203400)Shenzhen Fundamental Research Funding(JCYJ20210324115809026,JCYJ20220818100212027,and JCYJ20200109141216566)+7 种基金Shenzhen Science and Technology Program(KQTD20190929173815000)Guangdong scientific program with contract no.2019QN01L057Guangdong Innovative and Entrepreneurial Research Team Program(2019ZT08C044)to Gu Msupported by the National Natural Science Foundation of China(22033005)to Li Jpartially sponsored by Guangdong Provincial Key Laboratory of Catalysis(2020B121201002).support from Presidential fund and Development and Reform Commission of Shenzhen Municipalitysupported by the Center for Computational Science and Engineering at SUSTechthe CHEM high-performance supercomputer cluster(CHEMHPC)located at the Department of Chemistry,SUSTech。
基金Work at the Molecular Foundry was supported by the Office of Science,Office of Basic Energy Sciences,of the US Department of Energy under Contract No.DE-AC02-05CH11231This material is based upon work supported by the National Science Foundation Graduate Research Fellowship under Grant No.DGE-1752814This work was also supported by National Science Foundation STROBE grant DMR-1548924。
文摘High-throughput scanning electron microscopy(SEM)coupled with classification using neural networks is an ideal method to determine the morphological handedness of large populations of chiral nanoparticles.Automated labeling removes the time-consuming manual labeling of training data,but introduces label error,and subsequently classification error in the trained neural network.Here,we evaluate methods to minimize classification error when training from automated labels of SEM datasets of chiral Tellurium nanoparticles.Using the mirror relationship between images of opposite handed particles,we artificially create populations of varying label error.We analyze the impact of label error rate and training method on the classification error of neural networks on an ideal dataset and on a practical dataset.Of the three training methods considered,we find that a pretraining approach yields the most accurate results across label error rates on ideal datasets,where size and other morphological variables are held constant,but that a co-teaching approach performs the best in practical application.
