According to the international guidelines for proton single event effect ground test,the single event upset(SEU)cross-section induced by protons with energy levels around 200 MeV is widely recognized as the saturation...According to the international guidelines for proton single event effect ground test,the single event upset(SEU)cross-section induced by protons with energy levels around 200 MeV is widely recognized as the saturation SEU cross-section^([1,2]),which serves as the fundamental basis for predicting error rates of devices in realistic proton radiation environments.展开更多
基金National Natural Science Foundation of China(12105339,12035019,62174180)National Laboratory of Science and Technology on Analog Integrated Circuit(2021-JCJQ-LB-049-9)。
文摘According to the international guidelines for proton single event effect ground test,the single event upset(SEU)cross-section induced by protons with energy levels around 200 MeV is widely recognized as the saturation SEU cross-section^([1,2]),which serves as the fundamental basis for predicting error rates of devices in realistic proton radiation environments.