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A Contact and Non-Contact Hybrid Profilometer with Large Range
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作者 YUN Jianping YANG Xudong +1 位作者 xie tiebang CHANG Suping 《Wuhan University Journal of Natural Sciences》 CAS 2007年第6期1066-1072,共7页
A novel hybrid instrument of contact and non-contact measurement with large range is developed, and both measurement systems are based on a Linnik interference microscope and on white-light interference measuring tech... A novel hybrid instrument of contact and non-contact measurement with large range is developed, and both measurement systems are based on a Linnik interference microscope and on white-light interference measuring techniques. The ambiguity presented in conventional monochromatic interferometers is not present in the contact and non-contact measurement, and they have a virtually unlimited unambiguous range. For the contact measurement, the vertical measuring range is ±5 mm with a resolution of 1 nm and the horizontal measuring range is ±25 mm in x-range and y-range with a resolution of 1.25 μm; for the non-contact measurement, the vertical measuring range is ~5 mm with a resolution of 1 nm and the horizontal resolution better than 0.5 urn. 展开更多
关键词 surface topography contact/non-contact measurement interference microscope
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