Impulse-copling coefficients,for A1 and Cu samples with finite surface area irradiated in air by 1.06μm,10ns laser pulses produced by a Nd:YAG laser,have been measured experimentally.A modified theoretical model of i...Impulse-copling coefficients,for A1 and Cu samples with finite surface area irradiated in air by 1.06μm,10ns laser pulses produced by a Nd:YAG laser,have been measured experimentally.A modified theoretical model of impulse-coupling is proposed,which significantly improves the agreement between the calculated impulse-coupling coefficient and the measured one.展开更多
Depth profiles of fluorine in F-doped tin oxide(FTO)films prepared by atmospherical pressure chemical vapour deposition method have been studied by use of ^(19)F(p,αγ)^(16)O resonance nuclear reactions near 872.1 ke...Depth profiles of fluorine in F-doped tin oxide(FTO)films prepared by atmospherical pressure chemical vapour deposition method have been studied by use of ^(19)F(p,αγ)^(16)O resonance nuclear reactions near 872.1 keV.A proper convolution method was used to get the real depth profiles of fluorine from the measured y-ray excitation curves.Secondary ion mass spectrometry in conjunction with Rutherford backscattering spectrometry analysis was used to determine the density of the FTO films.It was found that the density of the films is markedly different from an earlier reported value.展开更多
文摘Impulse-copling coefficients,for A1 and Cu samples with finite surface area irradiated in air by 1.06μm,10ns laser pulses produced by a Nd:YAG laser,have been measured experimentally.A modified theoretical model of impulse-coupling is proposed,which significantly improves the agreement between the calculated impulse-coupling coefficient and the measured one.
文摘Depth profiles of fluorine in F-doped tin oxide(FTO)films prepared by atmospherical pressure chemical vapour deposition method have been studied by use of ^(19)F(p,αγ)^(16)O resonance nuclear reactions near 872.1 keV.A proper convolution method was used to get the real depth profiles of fluorine from the measured y-ray excitation curves.Secondary ion mass spectrometry in conjunction with Rutherford backscattering spectrometry analysis was used to determine the density of the FTO films.It was found that the density of the films is markedly different from an earlier reported value.
