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β-Ga_2O_3 thin film grown on sapphire substrate by plasmaassisted molecular beam epitaxy 被引量:4
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作者 Jiaqi Wei Kumsong Kim +11 位作者 Fang Liu Ping Wang xiantong zheng Zhaoying Chen Ding Wang Ali Imran Xin Rong Xuelin Yang Fujun Xu Jing Yang Bo Shen Xinqiang Wang 《Journal of Semiconductors》 EI CAS CSCD 2019年第1期71-75,共5页
Monoclinic gallium oxide(Ga_2O_3) has been grown on(0001) sapphire(Al_2O_3) substrate by plasma-assisted molecular beam epitaxy(PA-MBE). The epitaxial relationship has been confirmed to be [010]( 2ˉ01) β-Ga_2O_3||[ ... Monoclinic gallium oxide(Ga_2O_3) has been grown on(0001) sapphire(Al_2O_3) substrate by plasma-assisted molecular beam epitaxy(PA-MBE). The epitaxial relationship has been confirmed to be [010]( 2ˉ01) β-Ga_2O_3||[ 011ˉ0](0001)Al_2O_3 via in-situ reflection high energy electron diffraction(RHEED) monitoring and ex-situ X-ray diffraction(XRD) measurement. Crystalline quality is improved and surface becomes flatter with increasing growth temperature, with a best full width at half maximum(FWHM) of XRD ω-rocking curve of( 2ˉ01) plane and root mean square(RMS) roughness of 0.68° and 2.04 nm for the sample grown at 730 °C,respectively. Room temperature cathodoluminescence measurement shows an emission at ~417 nm, which is most likely originated from recombination of donor–acceptor pair(DAP). 展开更多
关键词 β-Ga2O3 SAPPHIRE SUBSTRATE PA-MBE CRYSTALLINE quality CL measurement
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Infrared stimulated emission with an ultralow threshold from low-dislocation-density InN films grown on a vicinal GaN substrate
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作者 Huapeng Liu Bowen Sheng +14 位作者 Tao Wang Konstantin Kudryavtsev Artem Yablonskiy Jiaqi Wei Ali Imran Zhaoying Chen Ping Wang xiantong zheng Renchun Tao Xuelin Yang Fujun Xu Weikun Ge Bo Shen Boris Andreev Xinqiang Wang 《Fundamental Research》 CAS 2022年第5期794-798,共5页
Near-infrared stimulated emission from a high-quality InN layer under optical pumping was observed with a threshold excitation power density of 0.3 and 4 kW cm^(−2) at T=8 and 77 K,respectively.To achieve such a low t... Near-infrared stimulated emission from a high-quality InN layer under optical pumping was observed with a threshold excitation power density of 0.3 and 4 kW cm^(−2) at T=8 and 77 K,respectively.To achieve such a low threshold power density,vicinal GaN substrates were used to reduce the edge-component threading dislocation(ETD)density of the InN film.Cross-sectional transmission electron microscopy images reveal that the annihilation of ETDs can be divided into two steps,and the ETD density can be reduced to approximately 5×10^(8) cm^(−2) near the surface of the 5-μm-thick film.The well-resolved phonon replica of the band-to-band emission in the photoluminescence spectra at 9 K confirm the high quality of the InN film.As a result,the feasibility of InN-based photonic structures and the underlying physics of their growth and emission properties are demonstrated. 展开更多
关键词 INN Stimulated emission Vicinal substrate Phonon replica Molecular beam epitaxy
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