期刊文献+
共找到2篇文章
< 1 >
每页显示 20 50 100
Characteristic pattern of human prostatic growth with age 被引量:30
1
作者 Shu-Jie XIA xiao-xin xu +2 位作者 Jian-Bao TENG Chun-Xiao xu Xiao-Da TANG 《Asian Journal of Andrology》 SCIE CAS CSCD 2002年第4期269-271,共3页
Aim: To study the characteristic pattern of the age-related growth of the human prostate gland. Methods: The volume (weight) of the prostate in 1,601 males, aged from newborn to 92 years, was determined by Bultrasonog... Aim: To study the characteristic pattern of the age-related growth of the human prostate gland. Methods: The volume (weight) of the prostate in 1,601 males, aged from newborn to 92 years, was determined by Bultrasonography. Results: Prostatic volume determination by B-ultrasonography in 1601 males (1301 normal subjects and 300 BPH patients) pointed out that the age-stratified growth of human prostate could be categorized into 4 life stages: (1) the first slow growing phase (from newborn to 9 years): the prostate grows slowly at a rate of 0.14g per year; (2) the first rapid growing phase (from 10 to 30 years): the prostate grows at a rate of 0.84 g per year; (3) the second slow growing phase (from 30 to 50 years), the prostate grows at a rate of 0.21 g per year; (4) the second rapid growing phase (from 50 to 90 years): the prostate grows at one of the following rates: in one group the growth rate is of 0.50 g per year and in the other 1.20 g per year, leading to benign prostatic hyperplasia (BPH). Conclusion: The volumes of the prostate are different in different age groups and it grows with age at different rates in four life phases. The prostate growth in phases can be expressed by the following equation: Y=19.36+1.36X'-0.58X'2+0.33X'3, where Y=prostate volume, X=age (up to 70 years), X'=(X-35.5)/10. (Asian JAndrol 2002 Dec; 4: 269-271) 展开更多
关键词 prostatic hypertrophy age factor B-ultrasonography ANDROGEN
下载PDF
Resistive switching memory for high density storage and computing
2
作者 xiao-xin xu Qing Luo +3 位作者 Tian-Cheng Gong Hang-Bing Lv Qi Liu Ming Liu 《Chinese Physics B》 SCIE EI CAS CSCD 2021年第5期26-51,共26页
The resistive random access memory(RRAM)has stimulated a variety of promising applications including programmable analog circuit,massive data storage,neuromorphic computing,etc.These new emerging applications have hug... The resistive random access memory(RRAM)has stimulated a variety of promising applications including programmable analog circuit,massive data storage,neuromorphic computing,etc.These new emerging applications have huge demands on high integration density and low power consumption.The cross-point configuration or passive array,which offers the smallest footprint of cell size and feasible capability of multi-layer stacking,has received broad attention from the research community.In such array,correct operation of reading and writing on a cell relies on effective elimination of the sneaking current coming from the neighboring cells.This target requires nonlinear I-V characteristics of the memory cell,which can be realized by either adding separate selector or developing implicit build-in nonlinear cells.The performance of a passive array largely depends on the cell nonlinearity,reliability,on/off ratio,line resistance,thermal coupling,etc.This article provides a comprehensive review on the progress achieved concerning 3D RRAM integration.First,the authors start with a brief overview of the associative problems in passive array and the category of 3D architectures.Next,the state of the arts on the development of various selector devices and self-selective cells are presented.Key parameters that influence the device nonlinearity and current density are outlined according to the corresponding working principles.Then,the reliability issues in 3D array are summarized in terms of uniformity,endurance,retention,and disturbance.Subsequently,scaling issue and thermal crosstalk in 3D memory array are thoroughly discussed,and applications of 3D RRAM beyond storage,such as neuromorphic computing and CMOL circuit are discussed later.Summary and outlooks are given in the final. 展开更多
关键词 resistive switching memory(RRAM) three-dimensional(3D)integration RELIABILITY COMPUTING
下载PDF
上一页 1 下一页 到第
使用帮助 返回顶部