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From Self-assembled Monolayers to Chemically Patterned Brushes:Controlling the Orientation of Block Copolymer Domains in Films by Substrate Modification 被引量:3
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作者 xiao-sa jin Yuan-yuan Pang 季生象 《Chinese Journal of Polymer Science》 SCIE CAS CSCD 2016年第6期659-659,660-678,共20页
Block copolymer lithography is emerging as one of the leading technologies for patteming nanoscale dense features. In almost all potential applications of this technology, control over the orientation of cylindrical a... Block copolymer lithography is emerging as one of the leading technologies for patteming nanoscale dense features. In almost all potential applications of this technology, control over the orientation of cylindrical and lamellar domains is required for pattern transfer from the block copolymer film. This review highlights the state-of-art development of brushes to modify the substrates to control the assembly behaviors of block copolymers in films. Selected important contributions to the development of self-assembled monolayers, polymer brushes and mats, and chemically patterned brushes are discussed. 展开更多
关键词 SELF-ASSEMBLY Block copolymer Neutral brush Chemical pattern Wetting behavior.
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