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Carbon Nitride Films Deposited on Pt Substrates byMicrowave Plasma Chemical Vapor Deposition
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作者 Yongping Zhang Yousong Gu +5 位作者 Xiangrong Chang Zhongzhuo Tian Dongxia Shi xiufang zhanga Lei Yuan Material Science and Engineering School, University of Science and Technology Beijing, Beijing 100083, China Beijing Laboratory of Vacuum Physics, Institut 《International Journal of Minerals,Metallurgy and Materials》 SCIE EI CAS CSCD 2000年第1期42-44,共3页
Carbon nitride thin films have been synthesized on polycrystalline Pt substrates using microwave plasma chemical vapor de- position (MPCVD) technique. The N/C atomic ratio is close to the stoichiometric value 1.33 of ... Carbon nitride thin films have been synthesized on polycrystalline Pt substrates using microwave plasma chemical vapor de- position (MPCVD) technique. The N/C atomic ratio is close to the stoichiometric value 1.33 of C_3N_4. The experimental X-ray diffraction spectra contain all the strong peaks of α-C_3N_4 and β -C_3N_4. The films are a mixture of α-C_3N_4 and β -C_3N_4. The observed Raman and FT- IR spectra support the existence of C-N covalent bond in carbon nitride compound. The bulk modulus detected by Nano II nanoindentor is up to 349 GPa. 展开更多
关键词 carbon nitride MPCVD thin film deposition
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