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Influences of Resistor-Type Superconducting Fault Current Limiter on Power System Transient Stability with Asymmetrical Short-Circuit Faults 被引量:1
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作者 xue-ping gu Zhi-Long Yang 《Journal of Electronic Science and Technology of China》 2008年第2期101-107,共7页
The transient stability of a single machine to infinite-busbar power system with resistortype superconducting fault current limiters (SFCL) is analyzed under asymmetrical short-circuit fault conditions. The SFCL is ... The transient stability of a single machine to infinite-busbar power system with resistortype superconducting fault current limiters (SFCL) is analyzed under asymmetrical short-circuit fault conditions. The SFCL is considered to introduce a resistance into the three-phase circuits when faults occur. Based on the power-angle curves for different short-circuit conditions of the single-line to ground, double-line to ground and line to line short-circuit faults, the influences of the SFCLs on transient stability are analyzed in detail. The time-domain simulation of transient stability is carried out to verify the analytical results. 展开更多
关键词 Equal-area criterion power angle curves power systems resistor-type SFCL transientstability.
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Measuring the Interfacial Thickness of Immiscible Polymer Blends by Nano-probing of Atomic Force Microscopy
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作者 Tian-Tian Li Si-Bo Cheng +3 位作者 Lian-Fang Feng xue-ping gu Cai-Liang Zhang guo-Hua Hu 《Chinese Journal of Polymer Science》 SCIE EI CAS CSCD 2022年第4期421-430,共10页
Immiscible polymer blends are an important family of polymer materials.The interfacial thickness between different phases is a very important parameter that dictates,to a great extent,the morphology and properties of ... Immiscible polymer blends are an important family of polymer materials.The interfacial thickness between different phases is a very important parameter that dictates,to a great extent,the morphology and properties of such a blend.This work explores and optimizes an up-to-date atomic force microscopy(AFM)of type NanoIR2^(TM) system in order to quantitatively measure the interfacial thickness of immiscible polymer blends.This system is equipped with two nano-probes capable of detecting the response of a material to an infrared pulse called AFM-infrared spectroscopy mode(AFM-IR)or conducting resonance called AFM-Lorentz Contact Resonance mode(AFM-LCR),respectively.Its potential for quantitatively measuring the interfacial thickness of immiscible polymer blends is evaluated using blends composed of polyamide 6(PA6)and polyolefin elastomer(POE)in the presence or absence of a POE containing maleic anhydride(POE-g-MAH)as a compatibilizer.Surface roughness affects adversely the signal intensity and consequently an accurate measurement of the interfacial thickness.Optimum sample surface preparation procedures are proposed. 展开更多
关键词 Polymer blends Interfacial thickness Atomic force microscopy Nano-probing Surface roughness
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