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Generation of cascaded four-wave-mixing with graphene-coated microfiber 被引量:1
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作者 Y.Wu B.C.Yao +8 位作者 Q.Y.Feng X.L.Cao X.Y.Zhou Y.J.Rao y.gong W.L.Zhang Z.G.Wang Y.F.Chen K.S.Chiang 《Photonics Research》 SCIE EI 2015年第2期64-68,共5页
A graphene-coated microfiber(GCM)-based hybrid waveguide structure formed by wrapping monolayer graphene around a microfiber with length of several millimeters is pumped by a nanosecond laser at ~1550 nm, and multiord... A graphene-coated microfiber(GCM)-based hybrid waveguide structure formed by wrapping monolayer graphene around a microfiber with length of several millimeters is pumped by a nanosecond laser at ~1550 nm, and multiorder cascaded four-wave-mixing(FWM) is effectively generated. By optimizing both the detuning and the pump power, such a GCM device with high nonlinearity and compact size would have potential for a wide range of FWM applications, such as phase-sensitive amplification, multi-wavelength filter, all-optical regeneration and frequency conversion, and so on. 展开更多
关键词 GCM FWM Generation of cascaded four-wave-mixing with graphene-coated microfiber wave
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Scanning electron microscope as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films
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作者 C.Trager-Cowan A.Alasmari +33 位作者 W.Avis J.Bruckbauer P.R.Edwards B.Hourahine S.Kraeusel G.Kusch R.Johnston G.Naresh-Kumar R.W.Martin M.Nouf-Allehiani E.Pascal L.Spasevski D.Thomson S.Vespucci P.J.Parbrook M.D.Smith J.Enslin F.Mehnke M.Kneissl C.Kuhn T.Wernicke S.Hagedorn A.Knauer V.Kueller S.Walde M.Weyers P.-M.Coulon P.A.Shields Y.Zhang L.Jiu y.gong R.M.Smith T.Wang A.Winkelmann 《Photonics Research》 SCIE EI CSCD 2019年第11期I0017-I0026,共10页
In this paper we describe the scanning electron microscopy techniques of electron backscatter diffraction, electron channeling contrast imaging, wavelength dispersive X-ray spectroscopy, and cathodoluminescence hypers... In this paper we describe the scanning electron microscopy techniques of electron backscatter diffraction, electron channeling contrast imaging, wavelength dispersive X-ray spectroscopy, and cathodoluminescence hyperspectral imaging. We present our recent results on the use of these non-destructive techniques to obtain information on the topography, crystal misorientation, defect distributions, composition, doping, and light emission from a range of UV-emitting nitride semiconductor structures. We aim to illustrate the developing capability of each of these techniques for understanding the properties of UV-emitting nitride semiconductors, and the benefits were appropriate, in combining the techniques. 展开更多
关键词 ELECTRON NITRIDE DOPING
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