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Measurement of Deep Energy Level in InP: Fe by the Method of OTCS
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作者 SHaO limei (Jilin polytechnic University, changchun 130022, chn) yanG Wei yanG Ming yan ruhui (technology academy of armor force of p. l. a., changchun 130117, chn ) 《Semiconductor Photonics and Technology》 CAS 1998年第2期78-83,共6页
We have measured the deep energy level of the InP: Fe which is semi -insulator through the method of OTCS. The effect of light intensity on OTCS measurement is mainly discussed. There are electron trap of E_T =0.34 eV... We have measured the deep energy level of the InP: Fe which is semi -insulator through the method of OTCS. The effect of light intensity on OTCS measurement is mainly discussed. There are electron trap of E_T =0.34 eV and hole trap of E_T = 1.13 eV in InP: Fe under the strong light and low temperature. The location of the OTCS peak of electron trap (E_T = 0.34 eV) moves towards the direction of high temperaturer, when the light intensity was increased, E_T is different under different light intensity. It is corrected in terms of theory that the stuff ratio of the deep energy level is affected by the light intensity. The experiments show that the error is decreased greatly with the correction. 展开更多
关键词 杂质能级 测量 光瞬态电流光谱 半导体材料 磷化铟
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