We fabricated direct-current superconducting quantum interference device magnetometers with single layer epi-taxial Tl_(2)Ba_(2)CaCu_(2)O_(x) films on 36.8° SrTiO_(3) bicrystal substrates.The white Aux noise and ...We fabricated direct-current superconducting quantum interference device magnetometers with single layer epi-taxial Tl_(2)Ba_(2)CaCu_(2)O_(x) films on 36.8° SrTiO_(3) bicrystal substrates.The white Aux noise and the field-flux transformation coefficient of the devices are 1.5 × 10^(-5)Φ0/√Hz and 40 nT/Φ0,respectively.The magnetometers can work in unshielded environment.展开更多
A way to determine some important etching parameters in the step fabrication for highTc step-edge Josephson junctions is described based on an analysis of the dynamics of the etching process.The optimum thickness of t...A way to determine some important etching parameters in the step fabrication for highTc step-edge Josephson junctions is described based on an analysis of the dynamics of the etching process.The optimum thickness of the etch mask is defined with negligible recession of the mask edge during the etch.Under this condition,the equilibrium angle of the steps etched on the SrTiO_(3)(STO)substrate with an Nb mask has been calculated to be about 76°.With optimized mask thickness,its sharp sidewall and straight edge,high-quality steps on STO substrates with step height from 200-300 nm and step angle above 70°are made.Josephson junctions and dc-SQUIDs with high reproducibility and less parameter scatter are obtained on the step substrates.展开更多
基金Supported by the National Center for R&D on Superconductivity and the Ministry of Science and Technology of China(NKBRSF-G19990646).
文摘We fabricated direct-current superconducting quantum interference device magnetometers with single layer epi-taxial Tl_(2)Ba_(2)CaCu_(2)O_(x) films on 36.8° SrTiO_(3) bicrystal substrates.The white Aux noise and the field-flux transformation coefficient of the devices are 1.5 × 10^(-5)Φ0/√Hz and 40 nT/Φ0,respectively.The magnetometers can work in unshielded environment.
基金Supported by the National Center for R&D on Superconductivity and the Ministry of Science and Technology of China(NKBRSF-G19990646).
文摘A way to determine some important etching parameters in the step fabrication for highTc step-edge Josephson junctions is described based on an analysis of the dynamics of the etching process.The optimum thickness of the etch mask is defined with negligible recession of the mask edge during the etch.Under this condition,the equilibrium angle of the steps etched on the SrTiO_(3)(STO)substrate with an Nb mask has been calculated to be about 76°.With optimized mask thickness,its sharp sidewall and straight edge,high-quality steps on STO substrates with step height from 200-300 nm and step angle above 70°are made.Josephson junctions and dc-SQUIDs with high reproducibility and less parameter scatter are obtained on the step substrates.
