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Quantitative Roughness Analysis of Post-harvest Agaricus bisporus by Atomic Force Microscopy 被引量:4
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作者 yanghong-shun FENGGuo-Ping +1 位作者 ANHong-Jie LIYun-Fei 《Acta Botanica Sinica》 CSCD 2004年第10期1249-1255,共7页
The moisture loss degree is important in determining the quality of post-harvest mushroom (Agaricus bisporus (Lange) Sing). Quantitative roughness analyzed by atomic force microscopy (AFM) was proposed to denote the d... The moisture loss degree is important in determining the quality of post-harvest mushroom (Agaricus bisporus (Lange) Sing). Quantitative roughness analyzed by atomic force microscopy (AFM) was proposed to denote the degree of shrinkage, with arithmetic average roughness (Ra) and root mean square roughness (Rq) as parameters, The initial value of Ra was (30.035±1.839)nm, while those of 2℃, 25℃ and dynamic temperature on the 2nd day were (40.139±3.359) nm, (54.393±13.534) nm and (41.197±6.555) nm, respectively. There is a similar tendency for the results of Ra and Rq Both values of roughness increased in duration of storage and with increasing temperatures. The three-dimensional profile of the pileus epicutis could signify the process of water evaporation intuitionally. The tendency was in accordance with the roughness results, especially for the earlier stage of the storage (0-2 d). The outcome of roughness analysis could signify the differences of storage conditions. It was shown that the roughness measured by atomic force microscopy effectively reflected the moisture loss degree of the mushroom pileus epicutis during post-harvest storage. 展开更多
关键词 原子力显微镜 伞菌属 蘑菇 采收 湿度
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