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Microstructures of metallic film and diamond growth from Fe-Ni-C system 被引量:12
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作者 XU Bin LI Musen +3 位作者 yin longwei CUI Jianjun LIU Yuxian GONG Jianhong 《Chinese Science Bulletin》 SCIE EI CAS 2002年第15期1258-1262,共5页
The microstructures of metallic film surrounding diamond have been systemically studied using the transmission electron microscopy (TEM) and the atom force microscopy (AFM). The film can be divided into three layers (... The microstructures of metallic film surrounding diamond have been systemically studied using the transmission electron microscopy (TEM) and the atom force microscopy (AFM). The film can be divided into three layers (inner layer near diamond, external layer near graphite and middle layer). The graphite cannot be directly transformed into diamond in the film at HTHP: there exists a parallelrelationship between (111) of γ-(Fe,Ni) and (110) of Fe3C in the inner layer; the sawtooth-like step morphology found by AFM on the film is similar to that of corresponding diamond surface. A new model for diamond growth at HPHT is proposed from the parallel relationship and sawtooth-like step morphology. It is believed that Fe3C may be a transitional phase in the course of diamond growth, γ-(Fe,Ni) in the inner layer can absorb carbon atom groups with lamella structure from Fe3C, and then the carbon groups stack on growing diamond. 展开更多
关键词 synthetic DIAMOND HIGH temperature and HIGH pressure metallic film TEM AFM.
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TEM observation of oxidation of CuZnAlMnNi shape memory alloy
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作者 BAI Yujun LU Chengwei +1 位作者 GENG Guili yin longwei 《Chinese Science Bulletin》 SCIE EI CAS 2001年第21期1837-1839,共3页
The atmospheric oxidation of a quenched CuZnAlMnNi alloy after ion-polishing was examined by transmission electron microscopy (TEM). It was found that a lot of oxide grains with various sizes yield homogeneously on th... The atmospheric oxidation of a quenched CuZnAlMnNi alloy after ion-polishing was examined by transmission electron microscopy (TEM). It was found that a lot of oxide grains with various sizes yield homogeneously on the surface of the alloy after exposure at room temperature for 90 d. The grains mainly form along the planes of stacking fault, meanwhile, they can also be observed at the stacking fault tetrahedrals or around the dislocation lines. The formation of the oxides gives rise to the reduction of the stacking faults, and even complete disappearance in some zones, which is partly responsible for the decrement of shape memory effect (SME) of the alloy quenched during long-term holding at room temperature. 展开更多
关键词 shape memory alloy OXIDATION STACKING FAULT TETRAHEDRAL DISLOCATION line.
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