Facilitators and barriers to parent-child communication in pediatric palliative care:An integrative review

Objectives:This study aimed to identify facilitators and barriers to parent-child communication in pediatric palliative care,providing insights for medical professionals developing targeted interventions to enhance parent-child communication and improve its effectiveness.Methods:Whittemore and Knafl’s integrative review method was employed to guide a systematic search for literature in six databases(Medline,Embase,CINAHL Complete,PsycINFO,Web of Science,and Cochrane Library).Peer-reviewer articles published in the English language from inception to December 2023.All of the identified studies were screened,extracted,and analyzed independently by two researchers.Results:Twenty-four articles were included.Thefindings of the relevant studies were analyzed using thematic analysis.Four themes were identified as facilitators:legacy-making,resilience training programs,guidance from the healthcare team,and positive communication.Seven themes were identified as barriers:denial,being unprepared and evasive,mutual protection,being overwhelmed by painful emotions and overloaded with information,incorrect views of medical professionals and parents,negative communication,and cultural context.Conclusions:Parents and professionals should avoid myths about protecting the child and encourage open communication that respects the child’s wishes.The specialized pediatric palliative care team should carefully monitor parent-child communication,determine if any obstacles exist,and design more interventions to enhance it.

Self-powered flexible fingerprint-recognition display based on a triboelectric nanogenerator

In the time of Internet of Things(IoT),alternating current electroluminescence(ACEL)has unique advantages in the fields of smart display and human–computer interaction.However,their reliance on external high-voltage AC power supplies poses challenges in terms of wearability and limits their practical application.This paper proposed an innovative scheme for preparing a feather triboelectric nanogenerator(F-TENG)using recyclable and environmentally friendly material.The highest open-circuit voltage,short-circuit current,and transferred charge of SF6-treated F-TENGs can reach 449 V,63μA,and 152 nC,which enables easy lighting of BaTiO_(3)^(-)doped ACEL devices.Using a human electrical potential,a single-electrode F-TENG is combined with ACEL device for self-powered fingerprint recognition display.These works achieve self-powered flexible wearable ACEL devices,which are not only efficient and portable but also have good application prospects in the human–computer interaction,functional displays,and wearable electronic devices.

Non-destructive electroluminescence inspection for LED epitaxial wafers based on soft single-contact operation

Non-destructive and accurate inspection of gallium nitride light-emitting diode(Ga N-LED)epitaxial wafers is important to Ga N-LED technology.However,the conventional electroluminescence inspection,the photoluminescence inspection,and the automated optical inspection cannot fulfill the complex technical requirements.In this work,an inspection method and an operation system based on soft single-contact operation,namely,single-contact electroluminescence(SC-EL)inspection,are proposed.The key component of the SC-EL inspection system is a soft conductive probe with an optical fiber inside,and an AC voltage(70Vpp,100 k Hz)is applied between the probe and the ITO electrode under the LED epitaxial wafer.The proposed SC-EL inspection can measure both the electrical and optical parameters of the LED epitaxial wafer at the same time,while not causing mechanical damage to the LED epitaxial wafer.Moreover,it is demonstrated that the SC-EL inspection has a higher electroluminescence wavelength accuracy than photoluminescence inspection.The results show that the non-uniformity of SC-EL inspection is 444.64%,which is much lower than that of photoluminescence inspection.In addition,the obtained electrical parameters from SC-EL can reflect the reverse leakage current(Is)level of the LED epitaxial wafer.The proposed SC-EL inspection can ensure high inspection accuracy without causing damage to the LED epitaxial wafer,which holds promising application in LED technology.

Non-contact and non-destructive in-situ inspection for CdSe quantum dot film based on the principle of field-induced photoluminescence quenching

CdSe quantum-dot(QD)film,as the core function layer,plays a key role in various optoelectronic devices.The thickness uniformity of QD films is one of the key factors to determine the overall photoelectric performance.Therefore,it is important to obtain the thickness distribution of large-area QD films.However,it is difficult for traditional methods to quickly get the information related to its thickness distribution without introducing additional damage.In this paper,a non-contact and non-destructive inspection method for in-situ detecting the thickness uniformity of CdSe QD film is proposed.The principle behind this in-situ inspection method is that the photoluminescence quenching phenomenon of the QD film would occur under a high electric field,and the degree of photoluminescence quenching is related to the thickness of the quantum dot films.Photoluminescence images of the same QD film without and with an electric field are recorded by a charge-coupled device camera,respectively.By transforming the brightness distribution of these two images,we can intuitively see the thickness information of the thin film array of QD.The proposed method provides a meaningful inspection for the manufacture of QD based lightemitting display.