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Dependence of switching process on the perpendicular magnetic anisotropy constant in P-MTJ
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作者 Mao-Sen Yang Liang Fang ya-qing chi 《Chinese Physics B》 SCIE EI CAS CSCD 2018年第9期635-638,共4页
We investigate the dependence of the switching process on the perpendicular magnetic anisotropy (PMA) constant in perpendicular spin transfer torque magnetic tunnel junctions (P-MTJs) using micromagnetic simulatio... We investigate the dependence of the switching process on the perpendicular magnetic anisotropy (PMA) constant in perpendicular spin transfer torque magnetic tunnel junctions (P-MTJs) using micromagnetic simulations. It is found that the final stable states of the magnetization distribution of the free layer after switching can be divided into three different states based on different PMA constants: vortex, uniform, and steady. Different magnetic states can be attributed to a trade-off among demagnetization, exchange, and PMA energies. The generation of the vortex state is also related to the non-uniform stray field from the polarizer, and the final stable magnetization is sensitive to the PMA constant. The vortex and uniform states have different switching processes, and the switching time of the vortex state is longer than that of the uniform state due to hindrance by the vortex. 展开更多
关键词 magnetic tunnel junction perpendicular magnetic anisotropy vortex state micromagnetic simula-tion
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Effect of temperature on heavy ion-induced single event transient on 16-nm FinFET inverter chains
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作者 蔡莉 池雅庆 +10 位作者 叶兵 刘郁竹 贺泽 王海滨 孙乾 孙瑞琪 高帅 胡培培 闫晓宇 李宗臻 刘杰 《Chinese Physics B》 SCIE EI CAS CSCD 2023年第4期504-510,共7页
The variations of single event transient(SET)pulse width of high-LET heavy ion irradiation in 16-nm-thick bulk silicon fin field-effect transistor(Fin FET)inverter chains with different driven strengths are measured a... The variations of single event transient(SET)pulse width of high-LET heavy ion irradiation in 16-nm-thick bulk silicon fin field-effect transistor(Fin FET)inverter chains with different driven strengths are measured at different temperatures.Three-dimensional(3D)technology computer-aided design simulations are carried out to study the SET pulse width and saturation current varying with temperature.Experimental and simulation results indicate that the increase in temperature will enhance the parasitic bipolar effect of bulk Fin FET technology,resulting in the increase of SET pulse width.On the other hand,the increase of inverter driven strength will change the layout topology,which has a complex influence on the SET temperature effects of Fin FET inverter chains.The experimental and simulation results show that the device with the strongest driven strength has the least dependence on temperature. 展开更多
关键词 heavy ion single event effect single event transient Fin FET inverter chain
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