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Design of a Low-Noise Front-End Readout Circuit for CdZnTe Detectors
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作者 Bo Gan Tingcun Wei +2 位作者 Wu Gao huiming Zeng yann hu 《Journal of Signal and Information Processing》 2013年第2期123-128,共6页
In this paper, the design of a novel low-noise front-end readout circuit for Cadmium zinc telluride (CdZnTe) X-ray and γ-ray detectors is described. The front-end readout circuits include the charge sensitive amplifi... In this paper, the design of a novel low-noise front-end readout circuit for Cadmium zinc telluride (CdZnTe) X-ray and γ-ray detectors is described. The front-end readout circuits include the charge sensitive amplifier (CSA) and the CR-RC shaper is implemented in TSMC 0.35 μm mixed-signal CMOS technology. The die size of the prototype chip is 4.9 mm × 2.2 mm. The simulation results show that, the noise performance is 46 electrons + 10 electrons/pF, and power consumption is 1.65 mW per channel. 展开更多
关键词 CDZNTE DETECTOR Low Noise FRONT-END READOUT CMOS
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