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Ghost Imaging with Deep Learning for Position Mapping of Weakly Scattered Light Source 被引量:1
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作者 yasuhiro mizutani Shoma Kataoka +1 位作者 Tsutomu Uenohara yasuhiro Takaya 《Nanomanufacturing and Metrology》 2021年第1期37-45,共9页
We propose ghost imaging(GI)with deep learning to improve detection speed.GI,which uses an illumination light with random patterns and a single-pixel detector,is correlation-based and thus suitable for detecting weak ... We propose ghost imaging(GI)with deep learning to improve detection speed.GI,which uses an illumination light with random patterns and a single-pixel detector,is correlation-based and thus suitable for detecting weak light.However,its detection time is too long for practical inspection.To overcome this problem,we applied a convolutional neural network that was constructed based on a classification of the causes of ghost image degradation.A feasibility experiment showed that when using a digital mirror device projector and a photodiode,the proposed method improved the quality of ghost images. 展开更多
关键词 Inspection METROLOGY Defect mapping Ghost imaging Single-pixel imaging Deep learning Weak light imaging
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Foreword to the Special Issue on Micro-and Nano-Metrology in Japan(II)
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作者 Yuki Shimizu yasuhiro mizutani Masaki Michihata 《Nanomanufacturing and Metrology》 2021年第2期67-68,共2页
Micro-and nano-metrology occupies an important position in modern production engineering where higher-precision machining is required.A visualization of the process is indispensable for the creation of new technologie... Micro-and nano-metrology occupies an important position in modern production engineering where higher-precision machining is required.A visualization of the process is indispensable for the creation of new technologies in state-of-the-art manufacturing that deals with the geometrical quantity at the micrometers/nanometer level.Precision micro-and nano-metrology is thus becoming increasingly important as the platform of various manufacturing technologies,as well as strategic tools for responding to rapidly changing fabrication techniques in many scientific and industrial fields. 展开更多
关键词 METROLOGY BECOMING JAPAN
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Foreword to the Special Issue on Micro- and Nano-Metrology in Japan(I)
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作者 Yuki Shimizu yasuhiro mizutani Masaki Michihata 《Nanomanufacturing and Metrology》 2021年第1期1-2,共2页
Micro-and nano-metrology occupies an important position in modern production engineering where higher-precision machining is required.A visualization of the process is indispensable for the creation of new technologie... Micro-and nano-metrology occupies an important position in modern production engineering where higher-precision machining is required.A visualization of the process is indispensable for the creation of new technologies in stateof-the-art manufacturing that deals with the geometrical quantity in micrometers/nanometers.Precision micro-and nano-metrology is thus becoming more and more important as the platform of various manufacturing technologies,as well as strategic tools for responding to rapidly changing fabrication techniques in many scientific and industrial fields. 展开更多
关键词 METROLOGY BECOMING JAPAN
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