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Characterization of irradiated nails in terms of depolarizing Mueller matrix decompositions
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作者 Sergey SAVENKOV Alexander V. PRIEZZHEV +2 位作者 yevgen oberemok Sergey SHOLOM Ivan KOLOMIETS 《Frontiers of Optoelectronics》 EI CSCD 2017年第3期308-316,共9页
Mueller matrices were measured for natural (or reference) samples of human nails and samples irradiated by a 2 Gy ionizing radiation dose. The elements of the total Mueller matrix as a function of scattering angle w... Mueller matrices were measured for natural (or reference) samples of human nails and samples irradiated by a 2 Gy ionizing radiation dose. The elements of the total Mueller matrix as a function of scattering angle were measured in backscattering mode at a wavelength of 632.8 nm. Several types of depolarizing Mueller matrix decompositions, namely, Ossikovsky, Williams, and Chipman, were calculated as a function of scattering angle for each nail sample. A comparative analysis of the sensitivity of the Mueller matrix decompositions in relation to the problem of emergency dose assessment in nails was performed. 展开更多
关键词 Mueller matrix DEPOLARIZATION human nails ionizing radiation dose SCATTERING
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