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Accurate structure determination of nanocrystals by continuous precession electron diffraction tomography 被引量:2
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作者 yihan shen Wenjia Sun +2 位作者 Yang Liu Zhengyang Zhou Junliang Sun 《Science China Materials》 SCIE EI CAS CSCD 2022年第5期1417-1420,共4页
Structures are the cornerstones of structure-function relationship research of materials.After more than a hundred years of development,single crystal X-ray diffraction(SC-XRD)becomes the most common method to determi... Structures are the cornerstones of structure-function relationship research of materials.After more than a hundred years of development,single crystal X-ray diffraction(SC-XRD)becomes the most common method to determine structures of materials.Nevertheless,the weak interaction between X-ray and matter requires crystals to be larger than 5μm ×5μm × 5μm for normal SC-XRD diffractometer.Recent appearances of X-ray free electron lasers(XFEL)and micro-focused synchrotron beamlines allow SC-XRD data collection from micron-sized crystals,but access to these facilities is limited.The development of three-dimensional(3D)electron diffraction(ED)has provided a powerful tool for scientists to explore the microcosmos,extending the limit of the SC-XRD method[1]. 展开更多
关键词 电子衍射 连续旋转 断层扫描 数据收集方法 步进式 纳米晶 微观世界 PEDT
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