The recrystallization texture in grain oriented silicon steel sheets, which were annealed at different primary annealingtemperatures with and without an electric field, was investigated. An automated electron backscat...The recrystallization texture in grain oriented silicon steel sheets, which were annealed at different primary annealingtemperatures with and without an electric field, was investigated. An automated electron backscattered diffraction(EBSD) technique was used to analyze the recrystallization texture. It was found that recovery and application ofelectric field in primary annealing lead to an increase of {001} component and a decrease of {111} component afterannealing at 900℃. The development of recrystallization texture can be explained in terms of the effects of electricfield and primary annealing temperature on recovery.展开更多
基金The authors are grateful for the financial support from the National Natural Science Foundation of ChinaShanghai Baosteel Group Cor poration(No.50130010)+1 种基金the Natural Science Foundation of Liaoning Province(No.2001102026)the Teaching and R esearch Encouragement P rogram for Excellent Young Teachers in Universities of Ministry of China.
文摘The recrystallization texture in grain oriented silicon steel sheets, which were annealed at different primary annealingtemperatures with and without an electric field, was investigated. An automated electron backscattered diffraction(EBSD) technique was used to analyze the recrystallization texture. It was found that recovery and application ofelectric field in primary annealing lead to an increase of {001} component and a decrease of {111} component afterannealing at 900℃. The development of recrystallization texture can be explained in terms of the effects of electricfield and primary annealing temperature on recovery.
