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Determining the effect of relative size of sensor on calibration accuracy of TEM cells 被引量:3
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作者 yun-sheng jiang Cui Meng +3 位作者 Han-Bing Jin Ping Wu Zhi-Qian Xu Liu-Hong Huang 《Nuclear Science and Techniques》 SCIE CAS CSCD 2019年第6期104-113,共10页
The time-domain calibration coefficient of a D-Dot sensor should be identical across various transverse electromagnetic (TEM) cells to comply with the IEEE Std 1309. However, in our previous calibration experiments, p... The time-domain calibration coefficient of a D-Dot sensor should be identical across various transverse electromagnetic (TEM) cells to comply with the IEEE Std 1309. However, in our previous calibration experiments, poor consistency was observed. The size of D-Dot sensors relative to TEM cells is considered the main reason for this poor consistency. Therefore, this study aims at determining the calibration coefficient of a D-Dot sensor. We calculate the theoretical coefficient as a reference. Practical calibration experiments involve the processing of TEM cells with three different sizes. To observe the response more clearly, corresponding models are constructed and numerical simulations are performed. The numerical simulations and experimental calibration are in good agreement. To determine the calibration accuracy, we quantify the accuracy using the relative error of the calibration coefficient. By comparing the coefficients obtained, it can be concluded that the perturbation error is about 15% when the relative size is over 1/3. Further, the relative size should be less than 1/5 to obtain a relative error below 10%. 展开更多
关键词 D-DOT Electromagnetic SENSOR TIME-DOMAIN CALIBRATION ACCURACY Numerical simulation
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Synergistic effects of total ionizing dose and radiated electromagnetic interference on analog-to-digital converter 被引量:3
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作者 Ping Wu Lin Wen +3 位作者 Zhi-Qian Xu yun-sheng jiang Qi Guo Cui Meng 《Nuclear Science and Techniques》 SCIE EI CAS CSCD 2022年第3期172-180,共9页
The influence of combined total ionization dose(TID)and radiated electromagnetic interference(EMI)in a commercial analog-to-digital converter(ADC)was studied.The degradation of the direct-current response,the static p... The influence of combined total ionization dose(TID)and radiated electromagnetic interference(EMI)in a commercial analog-to-digital converter(ADC)was studied.The degradation of the direct-current response,the static parameters,and the dynamic parameters caused by the TID and EMI separately and synergistically is presented.The experimental results demonstrate that the increase in TID intensifies data error and the signal-tonoise ratio(SNR)degradation caused by radiated EMI.The cumulative distribution function of EMI failure with respect to data error and SNR with different TIDs was extracted.The decreasing trend of the threshold was acquired with a small sample size of five for each TID group.The result indicates that the ADC is more sensitive in a compound radiation environment. 展开更多
关键词 Integrated circuit Total ionizing dose Electromagnetic radiation Synergistic effect Combined environment
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