Micro—structural analysis of YBa2Cu3O7—x thin films grown on different substrates by X—ray techniques

YBa2Cu3Ox(YBCO) thin films grown on different substrates with and/or without Eu2CuO4(ECO) buffer layer were investigated by X-ray wide angle diffraction,reflection,diffuse scattering and topography.Theresults show that for the yttria stabilized ZrO2(YSZ) substrate,the presence of an ECO buffer layer improves the crystalline quality of the YBCO film,while a negative effect is observed for the SrTiO3(STO) substrate.The lateral correlation length for a sample grown on a YSZ substrate with ECO buffer Layer is much greater than grown on an STO subetrate.The STO substrate used has mosaic structure.2001 Elsevier Science B.V.All rights reserved.

MICROSTRUCTURAL CHARACTERIZATION OF SPIN—VALVE MULTILAYERS BY X—RAY ANOMALYOUS DIFFRACTION TECHNIQUE

It is impossible to directly analyze the microstructure of spin-valve multilayers based on Ni,F,Cu and Mn by a conventional X-ray diffraction technique because the lattice parameter and atomic sattering factor sof them are very close.To solve this problem, we use an x-ray anomalous diffraction technique to characterize the microstructures of the [Ni80Fe20/Fe50Mn50]15 and [Ni80Fe20/Cu]15 superlattice systems.The results show that more diffraction peaks and higher internsity in the reflectivety profile are observed when the incident energy is close to the absorption edge of the lighter element(Mn) in [Ni80Fe20/Fe50Mn50]15 multilayer systems and to the absorption edge of the heavier element (Cu) in the [Ni80Fe20/Cu]15 multilayer systems.The interface and periodic structure of [Ni80F20/Fe50Mn50]15 are more perfect than that of the [Ni80Fe20/Cu]15 superlattices.The above results are disussed in this paper.