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功率器件芯片互连用低温烧结铜基电子浆料研究进展 被引量:6
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作者 徐恒一 徐红艳 +1 位作者 臧丽坤 徐菊 《电子元件与材料》 CAS CSCD 北大核心 2022年第1期9-18,共10页
随着电力电子器件向着更高功率密度、更小体积和更高集成度等方向发展,特别是第三代半导体SiC和GaN功率芯片的应用,研究满足高功率密度、高工作电压、耐高温的功率器件封装用互连材料成为近年来的重要课题,开发低温连接、高温服役的高... 随着电力电子器件向着更高功率密度、更小体积和更高集成度等方向发展,特别是第三代半导体SiC和GaN功率芯片的应用,研究满足高功率密度、高工作电压、耐高温的功率器件封装用互连材料成为近年来的重要课题,开发低温连接、高温服役的高可靠性无铅互连材料具有重要意义。低温烧结铜基浆料具有价格低廉、导电导热性能好、抗电迁移等优点,是新型功率器件封装互连中理想的连接材料之一。通过结合纳米银和纳米铜浆料的优点能够获得连接稳定、烧结和服役性能可靠的铜基接头。概述了包括纳米铜银混合浆料、纳米铜银合金浆料以及银包铜复合浆料等铜基浆料的常见制备技术,阐释了各种浆料的烧结机理和接头性能,并对高性能铜基浆料的应用前景进行了展望。 展开更多
关键词 低温烧结 电子封装 综述 无铅互连 铜基浆料 接头性能
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导热绝缘材料在电力电子器件封装中的应用 被引量:16
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作者 佟辉 臧丽坤 徐菊 《绝缘材料》 CAS 北大核心 2021年第12期1-9,共9页
本综述主要从当前硅(Si)基和下一代碳化硅(SiC)等宽禁带半导体电力电子器件封装应用的角度,论述在芯片封装过程中所用到的绝缘介质材料,并探讨其未来向高导热及耐高温方向发展的研究趋势。
关键词 导热 绝缘材料 电力电子器件 封装
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化学镀法制备Cu@Ni@Ag复合粉末及其性能 被引量:1
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作者 徐恒一 臧丽坤 徐菊 《电镀与涂饰》 CAS 北大核心 2022年第5期345-351,共7页
通过化学镀制备了包覆完整、壳层致密的银包镍包铜(标记为Cu@Ni@Ag)粉,重点研究了Ni含量和Ag含量对Cu@Ni@Ag粉形貌、抗氧化性及导电性的影响。结果表明:相比于Cu@Ag粉,Cu@Ni@Ag粉的抗氧化性明显提升,且随着Ni含量的升高而增强,但Cu@Ni@A... 通过化学镀制备了包覆完整、壳层致密的银包镍包铜(标记为Cu@Ni@Ag)粉,重点研究了Ni含量和Ag含量对Cu@Ni@Ag粉形貌、抗氧化性及导电性的影响。结果表明:相比于Cu@Ag粉,Cu@Ni@Ag粉的抗氧化性明显提升,且随着Ni含量的升高而增强,但Cu@Ni@Ag粉的导电性不如Cu@Ag粉。Ag含量对Cu@Ni@Ag粉抗氧化性的影响不大,增大银含量能够改善Cu@Ni@Ag粉的导电性。当铜粉与化学镀镍液的镍离子和化学镀银液的银离子的物质的量之比分别为2.2和4.8时,所得的Cu@Ni@Ag粉具有较佳的导电性和高温抗氧化性。 展开更多
关键词 铜粉 化学镀 形貌 高温抗氧化性 导电性
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Wetting behavior and interfacial characteristic of Sn-Ag-Cu solder alloy on Cu substrate 被引量:3
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作者 ZHANG XiaoRui YUAN ZhangFu +2 位作者 ZHAO HongXin zang likun LI JianQiang 《Chinese Science Bulletin》 SCIE EI CAS 2010年第9期797-801,共5页
Wettability of molten Sn-Ag-Cu alloy on Cu substrate has been determined by sessile drop method, as well as its dependence on time and temperature. It was found that the evolution of contact angle at the alloy’s melt... Wettability of molten Sn-Ag-Cu alloy on Cu substrate has been determined by sessile drop method, as well as its dependence on time and temperature. It was found that the evolution of contact angle at the alloy’s melting point experienced four different stages. Especially, the contact angle was unstable and fluctuant in stage II, and gradually decreased in stage III mainly due to a chemical reaction between Sn-Ag-Cu alloy and Cu substrate. The contact angle decreased with increasing temperature, but increased slightly at 629 K, for another chemical reaction occurred. Interfacial characteristic has been further investigated by examining the sample’s cross section. Intermetallic compounds of Cu6Sn5 and β-Sn phase were found at the interface of Sn-Ag-Cu/Cu. 展开更多
关键词 contact angle LEAD-FREE SOLDER sessile DROP method SN-AG-CU INTERMETALLIC compounds
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Spreading kinetics of a Sn-30Bi-0.5Cu alloy on a Cu substrate 被引量:1
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作者 zang likun YUAN ZhangFu +2 位作者 ZHAN YaPeng WANG ChenYu XU BingSheng 《Chinese Science Bulletin》 SCIE CAS 2012年第6期682-686,共5页
The reactive wetting kinetics of a Sn-30Bi-0.5Cu Pb-free solder alloy on a Cu substrate was investigated by the sessile drop method from 493 to 623 K.The triple line frontier,characterized by the drop base radius R wa... The reactive wetting kinetics of a Sn-30Bi-0.5Cu Pb-free solder alloy on a Cu substrate was investigated by the sessile drop method from 493 to 623 K.The triple line frontier,characterized by the drop base radius R was recorded dynamically with a high resolution CCD using different spreading processes in an Ar-H 2 flow.We found a good agreement with the De Gennes model for the relationship between ln(dR/dt) and lnR for the spreading processes at 493 and 523 K.However,a significant deviation from the De Gennes model was found for the spreading processes at 548 and 623 K.Our experimental results show a complicated temperature effect on the spreading kinetics.Intermetallics at the Sn-30Bi-0.5Cu/Cu interface were identified as Cu 6 Sn 5 adjacent to the solder and Cu 3 Sn adjacent to the Cu substrate.The intermetallic compounds effectively enhanced the triple line mobility because of reaction product formation at the diffusion frontier. 展开更多
关键词 传播过程 动力学 合金铜 基板 金属间化合物 关系模型 反应润湿 无铅焊锡
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