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Fabrication of High-Quality Niobium Superconducting Tunnel Junctions
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作者 XU Qin-Yin CAO Chun-Hai +6 位作者 LI Meng-Yue JIANG Yi zha shi-tong KANG Lin XU Wei-Wei CHEN Jian WU Pei-Heng 《Chinese Physics Letters》 SCIE CAS CSCD 2011年第8期289-292,共4页
For high-quality superconducting tunnel junctions(STJs),it is necessary to reduce leakage current as much as possible.We describe the fabrication of niobium STJs using the selective niobium(Nb)etching process and vari... For high-quality superconducting tunnel junctions(STJs),it is necessary to reduce leakage current as much as possible.We describe the fabrication of niobium STJs using the selective niobium(Nb)etching process and various ways to minimize the leakage current.The experiment shows that the leakage current mainly comes from shorts in the tunnel barrier layer rather than those around the junction edges.Through systematic analysis of the thin film stress,surface morphology and modified junction structures,we fabricate high-quality Nb STJs with a gap voltage of 2.8 mV and a leakage current at 1 mV as low as 8.1%and 0.023%at 4.2 K and 0.3 K,respectively. 展开更多
关键词 LEAKAGE TUNNEL FILM
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