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Combined-dynamic mode "dip-pen" nanolithography and physically nanopatterning along single DNA molecules 被引量:1
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作者 LIBin WANGYing +5 位作者 WUHaiping ZHANGYi ZHANGZhixiang zhouxingfei LIMinqian HUJun 《Chinese Science Bulletin》 SCIE EI CAS 2004年第7期665-667,共3页
Atomic force micriscope (AFM)-based dip-pen nanolithography (DPN) is an emerging approach for con-structing nanostructures on material surfaces such as gold, silicon and silicon oxide. Although DPN is a powerful tech-... Atomic force micriscope (AFM)-based dip-pen nanolithography (DPN) is an emerging approach for con-structing nanostructures on material surfaces such as gold, silicon and silicon oxide. Although DPN is a powerful tech-nique, it has not shown its ability of direct-writing and pat-terning of nanostructures on surfaces of soft materials, for example biomacromolecules. Direct depositing on soft sur-faces becomes possible with the introduction of a com-bined-dynamic mode DPN rather than mostly used contact mode DPN or tapping mode DPN. In this report, the com-bined dynamic mode DPN is used for direct depositing pro-tein ink on DNA molecules at the nanometer scale. 展开更多
关键词 原子力显微镜 浸笔纳米光刻技术 单个DNA分子 纳米结构 材料表面 结合动力模型 纳米图案
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Height measurement of DNA molecules with lift mode AFM 被引量:1
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作者 GUOYunchang zhouxingfei +2 位作者 SUNJielin LIMinqian HUJun 《Chinese Science Bulletin》 SCIE EI CAS 2004年第15期1574-1577,共4页
The height of double-stranded DNA (dsDNA) is measured by lift mode AFM combined with conventional tapping mode AFM. While the tip scan height is raised step by step, the tip pressure on sample is decreased gradually. ... The height of double-stranded DNA (dsDNA) is measured by lift mode AFM combined with conventional tapping mode AFM. While the tip scan height is raised step by step, the tip pressure on sample is decreased gradually. As a result, the deformation of the DNA strands decreases, and the height of double-stranded DNA (dsDNA) molecule can be deduced by the tip lift height. The measured height of dsDNA is 1.5±0.2 nm in lift mode, but only 0.8±0.2 nm in conventional tapping mode. This demonstrates that the tip pressure is a key factor in soft sample height measurement resulting in artificating lower values via conventional tap- ping mode. 展开更多
关键词 高度测量 DNA分子 弹性形变 双股DNA 原子力显微镜 升力扫描高度
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