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Total dose radiation characteristics of n-channel MOSFETs fabricated using FIPOS technology 被引量:1
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作者 zhushi-yang Gao-Jian-Xia 《Nuclear Science and Techniques》 SCIE CAS CSCD 1997年第3期170-173,共4页
TotaldoseradiationcharacteristicsofnchannelMOSFETsfabricatedusingFIPOStechnologyZhuShiYang,HuangYiPing,WuDon... TotaldoseradiationcharacteristicsofnchannelMOSFETsfabricatedusingFIPOStechnologyZhuShiYang,HuangYiPing,WuDongPing(Depart... 展开更多
关键词 多孔氧化硅 CMOS 总剂量 辐照特征
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Total dose radiation effects of pressure sensors fabricated on Unibond-SOI materials
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作者 zhushi-yang HUANGYi-Ping 《Nuclear Science and Techniques》 SCIE CAS CSCD 2001年第3期209-214,共6页
Piezoresistive pressure sensors with a twin-island structure were suc- cessfully fabricated using high quality Unibond-SOI (On Insulator) materials. Since the piezoresistors were structured by the single crystalline s... Piezoresistive pressure sensors with a twin-island structure were suc- cessfully fabricated using high quality Unibond-SOI (On Insulator) materials. Since the piezoresistors were structured by the single crystalline silicon overlayer of the SOI wafer and were totally isolated by the buried SiO2. the sensors are radiation-hard. The sensitivity and the linearity of the pressure sensors keep their original values after being irradiated by 60Co γ-rays up to 2.3×104Gy (H2O). However, the offset voltage of the sensor has a slight drift, increasing with the radiation dose. The absolute value of the offset voltage deviation depends on the pressure sensor itself. For comparison, corresponding polysilicon pressure sensors were fabricated using the similar process and irradiated at the same condition. 展开更多
关键词 半导体集成电路 SOI材料 大剂量辐照效应
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