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Structure,phase evolution and properties of Ta films deposited using hybrid high-power pulsed and DC magnetron co-sputtering
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作者 Min Huang Yan-Song Liu +1 位作者 zhi-bing he Yong Yi 《Chinese Physics B》 SCIE EI CAS CSCD 2022年第6期557-562,共6页
Crystalline phase and microstructure control are critical for obtaining desired properties of Ta films deposited by magnetron sputtering.Structure,phase evolution and properties of Ta films deposited by using hybrid h... Crystalline phase and microstructure control are critical for obtaining desired properties of Ta films deposited by magnetron sputtering.Structure,phase evolution and properties of Ta films deposited by using hybrid high power impulse magnetron sputtering(HiPIMS)and direct current magnetron sputtering(DCMS)under different fractions of DCMS power were investigated,where Ta ion to Ta neutral ratios of the deposition flux were changed.The results revealed that the number of Ta ions arriving on the substrate/growing film plays an important role in structure and phase evolution of Ta films.It can effectively avoid the unstable arc discharge under low pressure and show a higher deposition rate by combining HiPIMS and DCMS compared with only HiPIMS.Meanwhile,the high hardnessα-Ta films can be directly deposited by hybrid co-sputtering compared to those prepared by DCMS.In the co-sputtering technology,pureα-Ta phase films with extremely fine,dense and uniform crystal grains were obtained,which showed smooth surface roughness(3.22 nm),low resistivity(38.98μ?·cm)and abnormal high hardness(17.64 GPa). 展开更多
关键词 hybrid sputtering tantalum thin film STRUCTURE HARDNESS
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