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Iterative and accurate determination of small angle X-ray scattering background
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作者 geng Wang Li-Feng Xu +5 位作者 Jian-Lei Shen Guang-Bao Yao zhi-lei ge Wen-Qin Li Chun-Hai Fan Gang Chen 《Nuclear Science and Techniques》 SCIE CAS CSCD 2016年第5期109-113,共5页
X-ray scattering is widely used in material structural characterizations.The weak scattering nature,however,makes it susceptible to background noise and can consequently render the final results unreliable.In this pap... X-ray scattering is widely used in material structural characterizations.The weak scattering nature,however,makes it susceptible to background noise and can consequently render the final results unreliable.In this paper,we report an iterative method to determine X-ray scattering background and demonstrate its feasibility by small angle X-ray scattering on gold nanoparticles.This method solely relies on the correct structural modeling of the sample to separate scattering signal from background in data fitting processes,which allows them to be immune from experimental uncertainties.The importance of accurate determination of the scaling factor for background subtraction is also illustrated. 展开更多
关键词 小角X射线散射 迭代方法 精确测定 背景噪声 数据拟合 结构建模 不确定性 准确测定
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