Based on an analysis of symmetry, the dispersion relations near the Ai valley in strained Si1-x Gex （0≤x〈0.45）/ （001）, （111）, （101）Si are derived using the KP method with perturbation theory. These relations...Based on an analysis of symmetry, the dispersion relations near the Ai valley in strained Si1-x Gex （0≤x〈0.45）/ （001）, （111）, （101）Si are derived using the KP method with perturbation theory. These relations demonstrate that △^i levels in strained Si1-x Gex are different from the △1 level in relaxed Si1-x Gex, while the longitudinal and transverse masses （m1^＊ and mt^＊ ） are unchanged under strain. The energy shift between the △^i levels and the △1 level follows the linear deformation potential theory. Finally,a description of the conduction band （CB） edge in biaxially strained layers is given.展开更多
文摘Based on an analysis of symmetry, the dispersion relations near the Ai valley in strained Si1-x Gex （0≤x〈0.45）/ （001）, （111）, （101）Si are derived using the KP method with perturbation theory. These relations demonstrate that △^i levels in strained Si1-x Gex are different from the △1 level in relaxed Si1-x Gex, while the longitudinal and transverse masses （m1^＊ and mt^＊ ） are unchanged under strain. The energy shift between the △^i levels and the △1 level follows the linear deformation potential theory. Finally,a description of the conduction band （CB） edge in biaxially strained layers is given.
