期刊文献+
共找到6篇文章
< 1 >
每页显示 20 50 100
Review of Electronic Speckle Pattern Interferometry(ESPI) for Three Dimensional Displacement Measurement 被引量:22
1
作者 YANG Lianxiang XIE Xin +2 位作者 ZHU Lianqing WU Sijin WANG Yonghong 《Chinese Journal of Mechanical Engineering》 SCIE EI CAS CSCD 2014年第1期1-13,共13页
Three dimensional(3D) displacements, which can be translated further into 3D strain, are key parameters tor design, manufacturing and quality control. Using different optical setups, phase-shift methods, and algorit... Three dimensional(3D) displacements, which can be translated further into 3D strain, are key parameters tor design, manufacturing and quality control. Using different optical setups, phase-shift methods, and algorithms, several different 3D electronic speckle pattern interferometry(ESPl) systems for displacement and strain measurements have been achieved and commercialized. This paper provides a review of the recent developments in ESPI systems for 3D displacement and strain measurement. After an overview of the fundamentals of ESP! theory, temporal phase-shift, and spatial phase-shift techniques, 3D deformation measurements by the temporal phase-shift ESPI system, which is suited well for static measurement, and by the spatial phase-shift ESPI system, which is particularly useful for dynamic measurement, are discussed. For each method, the basic theory, a brief derivation and different optical layouts are presented. The state of art application, potential and limitation of the ESPI systems are shown and demonstrated. 展开更多
关键词 electronic speckle pattern interferometry(ESPI) three dimensional displacement and strain measurement static loading dynamic loading phase-shift technology
下载PDF
Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations 被引量:1
2
作者 朱云龙 Julien Vaillant +3 位作者 Guillaume Montay Manuel Fran?ois Yassine Hadjar Aurélien Bruyant 《Chinese Optics Letters》 SCIE EI CAS CSCD 2018年第7期40-44,共5页
Electronic speckle pattern interferometry(ESPI) and digital speckle pattern interferometry are wellestablished non-contact measurement methods. They have been widely used to carry out precise deformation mapping. Ho... Electronic speckle pattern interferometry(ESPI) and digital speckle pattern interferometry are wellestablished non-contact measurement methods. They have been widely used to carry out precise deformation mapping. However, the simultaneous two-dimensional(2D) or three-dimensional(3D) deformation measurements using ESPI with phase shifting usually involve complicated and slow equipment. In this Letter, we solve these issues by proposing a modified ESPI system based on double phase modulations with only one laser and one camera. In-plane normal and shear strains are obtained with good quality. This system can also be developed to measure 3D deformation, and it has the potential to carry out faster measurements with a highspeed camera. 展开更多
关键词 Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations
原文传递
Image processing of ESPI based on measurement the welding dynamic displacement fields
3
作者 陶军 李冬青 +1 位作者 范成磊 刘忠国 《China Welding》 EI CAS 2004年第2期111-114,共4页
A dual-beam electronic speckle pattern interferometry (ESPI) system was adopted to get speckle patterns for the measurement of welding dynamic displacement fields. The mathematical model of this system was described, ... A dual-beam electronic speckle pattern interferometry (ESPI) system was adopted to get speckle patterns for the measurement of welding dynamic displacement fields. The mathematical model of this system was described, based on which methods of the ESPI pattern image processing were discussed. Gray transformation and histogram equalization were used to enhance the contrast of speckle patterns. A discrete cosine image processing method was carried out and an exponent low-pass filter was chosen to reduce multiplicative noise in speckle patterns. Speckle grain noise can be eliminated effectively after these processes. 展开更多
关键词 WELDING electronic speckle pattern interferometry image processing discrete cosine low-pass exponent filter
下载PDF
Pitting Kinetics of 304 Stainless Steel Using ESPI Detection Technique 被引量:4
4
作者 Wen-Ming Tian Ying-Jun Ai +2 位作者 Song-Mei Li Nan Du Chao Ye 《Acta Metallurgica Sinica(English Letters)》 SCIE EI CAS CSCD 2015年第4期430-437,共8页
The electronic speckle pattern interferometer was used to in situ monitor the pitting corrosion of 304 stainless steel at anodic polarization. The pitting current and pitting current density of a single pit were obtai... The electronic speckle pattern interferometer was used to in situ monitor the pitting corrosion of 304 stainless steel at anodic polarization. The pitting current and pitting current density of a single pit were obtained. The pit growth was controlled by the corrosion products diffusion. The pit morphology was observed by a scanning electron microscope. The results showed that the pit was dish shaped, and the geometric parameters and pit growth time conformed to the function of Y = A + B1t + B2t2 + B3t3. 展开更多
关键词 Stainless steel CORROSION electronic speckle pattern interferometry (ESPI) PITTING
原文传递
Shearography and its applications-a chronological review 被引量:2
5
作者 Rajpal Sirohi 《Light(Advanced Manufacturing)》 2022年第1期1-30,共30页
This paper presents the activities in the field of shearography in chronological order and highlights the great potential of this holographic measurement technology.After a brief introduction,the basic theory of shear... This paper presents the activities in the field of shearography in chronological order and highlights the great potential of this holographic measurement technology.After a brief introduction,the basic theory of shearography is presented.Shear devices,phase-shift arrangements,and multiplexed shearography systems are described.Finally,the application areas where shearography has been accepted and successfully used as a tool are presented. 展开更多
关键词 electronic speckle pattern interferometry SHEAROGRAPHY Non-destructive testing
原文传递
A DEVELOPED FULL-FIELD FEM ANALYSIS COMBINED WITH ESPI FOR THE INVESTIGATION OF DEFECT EVOLUTION IN POLYMER FILMS
6
作者 Xiao-fang Liu Shuai-xia Tan +2 位作者 Xiao-li Zhang 赵宁 徐坚 《Chinese Journal of Polymer Science》 SCIE CAS CSCD 2013年第7期1022-1028,共7页
A full-field finite element method (FEM) analysis combined with electronic speckle pattern interferometry (ESPI) measurement was developed to investigate defect evolution in polymer films. Different from the previ... A full-field finite element method (FEM) analysis combined with electronic speckle pattern interferometry (ESPI) measurement was developed to investigate defect evolution in polymer films. Different from the previous reports, which only compare the ESPI experimental and FEM simulated results at several points or lines, herein the full-field FEM results were exported, subtracted with a continuous distribution. By choosing proper parameters and number of substeps, the simulated and experimental results showed excellent correspondence. Furthermore, the displacement fields vertical to the tensional direction were also presented, and the strain field was preliminarily evaluated. The current method of combination of ESPI and FEM allows for capturing the experimental fringe maps to validate and optimize FEM results simulated, and would give a higher security to structural and mechanical analysis of polymeric materials. 展开更多
关键词 electronic speckle pattern interferometry Finite element method DEFECT In-plane displacement Polymer film.
原文传递
上一页 1 下一页 到第
使用帮助 返回顶部