The random telegraph signal noise in the pixel source follower MOSFET is the principle component of the noise in the CMOS image sensor under low light. In this paper, the physical and statistical model of the random t...The random telegraph signal noise in the pixel source follower MOSFET is the principle component of the noise in the CMOS image sensor under low light. In this paper, the physical and statistical model of the random telegraph signal noise in the pixel source follower based on the binomial distribution is set up. The number of electrons captured or released by the oxide traps in the unit time is described as the random variables which obey the binomial distribution. As a result,the output states and the corresponding probabilities of the first and the second samples of the correlated double sampling circuit are acquired. The standard deviation of the output states after the correlated double sampling circuit can be obtained accordingly. In the simulation section, one hundred thousand samples of the source follower MOSFET have been simulated,and the simulation results show that the proposed model has the similar statistical characteristics with the existing models under the effect of the channel length and the density of the oxide trap. Moreover, the noise histogram of the proposed model has been evaluated at different environmental temperatures.展开更多
We investigated the effect of charge trapping on electrical characteristics of silicon junctionless nanowire transistors which are fabricated on heavily n-type doped silicon-on-insulator substrate. The obvious random ...We investigated the effect of charge trapping on electrical characteristics of silicon junctionless nanowire transistors which are fabricated on heavily n-type doped silicon-on-insulator substrate. The obvious random telegraph noise and current hysteresis observed at the temperature of 10 K indicate the existence of acceptor-like traps. The position depth of the traps in the oxide from Si/SiO_(2) interface is 0.35 nm, calculated by utilizing the dependence of the capture and emission time on the gate voltage. Moreover, by constructing a three-dimensional model of tri-gate device structure in COMSOL Multiphysics simulation software, we achieved the trap density of 1.9 × 10^(12) cm^(–2) and the energy level position of traps at 0.18 eV below the intrinsic Fermi level.展开更多
The correlation model between dark current RTS noise and defects for A1GalnP multiple-quantum-well laser diode is derived. Experimental results show that dark current RTS noise caused carrier number fluctuations at th...The correlation model between dark current RTS noise and defects for A1GalnP multiple-quantum-well laser diode is derived. Experimental results show that dark current RTS noise caused carrier number fluctuations at the interface of the heterojunction in the active region. According to this correlation model, the defect types are determined, and the defects＇ energy levels are quantitatively determined. The comer frequency of RTS noise power spectral density is analyzed. The experimental results are in good agreement with the theoretical. This result provided an effective method for estimating the deep-level traps in the active region of A1GaInP multiple quantum well laser diode.展开更多
基金Project supported by the National Natural Science Foundation of China(Grant Nos.61372156 and 61405053)the Natural Science Foundation of Zhejiang Province of China(Grant No.LZ13F04001)
文摘The random telegraph signal noise in the pixel source follower MOSFET is the principle component of the noise in the CMOS image sensor under low light. In this paper, the physical and statistical model of the random telegraph signal noise in the pixel source follower based on the binomial distribution is set up. The number of electrons captured or released by the oxide traps in the unit time is described as the random variables which obey the binomial distribution. As a result,the output states and the corresponding probabilities of the first and the second samples of the correlated double sampling circuit are acquired. The standard deviation of the output states after the correlated double sampling circuit can be obtained accordingly. In the simulation section, one hundred thousand samples of the source follower MOSFET have been simulated,and the simulation results show that the proposed model has the similar statistical characteristics with the existing models under the effect of the channel length and the density of the oxide trap. Moreover, the noise histogram of the proposed model has been evaluated at different environmental temperatures.
基金supported by the National Natural Science Foundation of China(Grant Nos.613760966,1327813,61404126 and 11947115)the Natural Science Foundation of Henan Province under(Grant No.202300410444)Foreign Experts Program of Ministry of Science and Technology in China(Grant No.G2021026027L)。
文摘We investigated the effect of charge trapping on electrical characteristics of silicon junctionless nanowire transistors which are fabricated on heavily n-type doped silicon-on-insulator substrate. The obvious random telegraph noise and current hysteresis observed at the temperature of 10 K indicate the existence of acceptor-like traps. The position depth of the traps in the oxide from Si/SiO_(2) interface is 0.35 nm, calculated by utilizing the dependence of the capture and emission time on the gate voltage. Moreover, by constructing a three-dimensional model of tri-gate device structure in COMSOL Multiphysics simulation software, we achieved the trap density of 1.9 × 10^(12) cm^(–2) and the energy level position of traps at 0.18 eV below the intrinsic Fermi level.
基金Supported by West Light Foundation of Chinese Academy of Sciences(2020-XBQNXZ-004)Key Deployment Projects of Chinese Academy of Sciences(ZDRW-CN-2020-2)+1 种基金Youth Innovation Promotion Association of Chinese Academy of Sciences(2021437)Tian Shan Qing Nian Project(2018Q006)。
文摘The correlation model between dark current RTS noise and defects for A1GalnP multiple-quantum-well laser diode is derived. Experimental results show that dark current RTS noise caused carrier number fluctuations at the interface of the heterojunction in the active region. According to this correlation model, the defect types are determined, and the defects＇ energy levels are quantitatively determined. The comer frequency of RTS noise power spectral density is analyzed. The experimental results are in good agreement with the theoretical. This result provided an effective method for estimating the deep-level traps in the active region of A1GaInP multiple quantum well laser diode.
文摘用非平衡格林函数理论和紧束缚模型近似计算长沟道弹道输运p型碳纳米管场效应管中电流强度.研究当场效应管介质(SiO2)中存在两个带电缺陷时,载流子散射所引起的电流强度减小和栅极阈值电压偏移量与缺陷位置的关系.介质中两个缺陷所带电荷Q1=Q2=+e(-e为电子电荷),都靠近源极或者都靠近漏极,或者一个电荷靠近源极另一个电荷靠近漏极.在工作状态下,所引起的电流强度相对减小比介质中只存在单个正电荷Q=+e且靠近源极(或漏极)时所引起的电流强度相对减小大得多.如果两个正电荷都在沟道中央附近,随着两个电荷的轴向距离减小,栅极阈值电压偏移的绝对值明显增加.栅极阈值电压偏移可达到-0.35 V.
