Modified DS np Chart Using Generalized Multiple Dependent State Sampling under Time Truncated Life Test

This study presents the design of a modified attributed control chart based on a double sampling(DS)np chart applied in combination with generalized multiple dependent state(GMDS)sampling to monitor the mean life of the product based on the time truncated life test employing theWeibull distribution.The control chart developed supports the examination of the mean lifespan variation for a particular product in the process of manufacturing.Three control limit levels are used:the warning control limit,inner control limit,and outer control limit.Together,they enhance the capability for variation detection.A genetic algorithm can be used for optimization during the in-control process,whereby the optimal parameters can be established for the proposed control chart.The control chart performance is assessed using the average run length,while the influence of the model parameters upon the control chart solution is assessed via sensitivity analysis based on an orthogonal experimental design withmultiple linear regression.A comparative study was conducted based on the out-of-control average run length,in which the developed control chart offered greater sensitivity in the detection of process shifts while making use of smaller samples on average than is the case for existing control charts.Finally,to exhibit the utility of the developed control chart,this paper presents its application using simulated data with parameters drawn from the real set of data.

A Novel Multiple Dependent State Sampling Plan Based on Time Truncated Life Tests Using Mean Lifetime

The design of a new adaptive version of the multiple dependent state(AMDS)sampling plan is presented based on the time truncated life test under the Weibull distribution.We achieved the proposed sampling plan by applying the concept of the double sampling plan and existing multiple dependent state sampling plans.A warning sign for acceptance number was proposed to increase the probability of current lot acceptance.The optimal plan parameters were determined simultaneously with nonlinear optimization problems under the producer’s risk and consumer’s risk.A simulation study was presented to support the proposed sampling plan.A comparison between the proposed and existing sampling plans,namely multiple dependent state(MDS)sampling plans and a modified multiple dependent state(MMDS)sampling plan,was considered under the average sampling number and operating characteristic curve values.In addition,the use of two real datasets demonstrated the practicality and usefulness of the proposed sampling plan.The results indicated that the proposed plan is more flexible and efficient in terms of the average sample number compared to the existing MDS and MMDS sampling plans.

Designing Adaptive Multiple Dependent State Sampling Plan for Accelerated Life Tests

A novel adaptive multiple dependent state sampling plan(AMDSSP)was designed to inspect products from a continuous manufacturing process under the accelerated life test(ALT)using both double sampling plan(DSP)and multiple dependent state sampling plan(MDSSP)concepts.Under accelerated conditions,the lifetime of a product follows the Weibull distribution with a known shape parameter,while the scale parameter can be determined using the acceleration factor(AF).The Arrhenius model is used to estimate AF when the damaging process is temperature-sensitive.An economic design of the proposed sampling plan was also considered for the ALT.A genetic algorithm with nonlinear optimization was used to estimate optimal plan parameters to minimize the average sample number(ASN)and total cost of inspection(TC)under both producer’s and consumer’s risks.Numerical results are presented to support the AMDSSP for the ALT,while performance comparisons between the AMDSSP,the MDSSP and a single sampling plan(SSP)for the ALT are discussed.Results indicated that the AMDSSP was more flexible and efficient for ASN and TC than the MDSSP and SSP plans under accelerated conditions.The AMDSSP also had a higher operating characteristic(OC)curve than both the existing sampling plans.Two real datasets of electronic devices for the ALT at high temperatures demonstrated the practicality and usefulness of the proposed sampling plan.

Effect of sample size on the response of DEM samples with a realistic grading

This paper shows that for DEM simulations of triaxial tests using samples with a grading that is repre- sentative of a real soil, the sample size significantly influences the observed material response. Four DEM samples with identical initial states were produced： three cylindrical samples bounded by rigid wails and one bounded by a cubical periodic cell, When subjected to triaxial loading, the samples with rigid boundaries were more dilative, stiffer and reached a higher peak stress ratio than the sample enclosed by periodic boundaries. For the rigid-wall samples, dilatancy increased and stiffness decreased with increasing sample size, The periodic sample was effectively homogeneous, The void ratio increased and the contact density decreased close to the rigid walls, This heterogeneity reduced with increasing sample size. The positions of the critical state lines （CSLs） of the overall response in e-log p＇ space were sensitive to the sample size, although no difference was observed between their slopes. The critical states of the interior regions of the rigid-wall-bounded samples approached that of the homogeneous periodic sample with increasing sample size. The ultimate strength of the material at the critical state is independent of sample size.