The texture evolution and lattice rotation in Al alloy 6111 with an initial {001} <110> component during symmetrical and asymmetrical rolling were investigated by means of orientation distribution function(ODF)....The texture evolution and lattice rotation in Al alloy 6111 with an initial {001} <110> component during symmetrical and asymmetrical rolling were investigated by means of orientation distribution function(ODF). The results show that the as-rolled initial {001}<110 > entation evolves into not only the copper orientation but also all the other orientations along the β fiber, including the brass orientation, by lattice rotation around special directions. Compared with the symmetrical rolling, the {001}<110 > component in the surface layer on the slower roller side evolves more quickly into the orientations along the β fiber during asymmetrical rolling, while that in the surface layer on the faster roller side evolves more slowly.展开更多
The highly （1301） oriented triple system of [CoPt/C]n/Ag films was deposited on glass substrates by DC and RF magnetron sputtering. After annealing at 600℃ for 30 min, thin films become magnetically hard with coerc...The highly （1301） oriented triple system of [CoPt/C]n/Ag films was deposited on glass substrates by DC and RF magnetron sputtering. After annealing at 600℃ for 30 min, thin films become magnetically hard with coercivities in the range of 160-875 kA/m because of high anisotropy associated with the L10 ordered phase. C doping plays an important role in improving （001） texture and reducing the intergrain interactions. The oriented growth of CoPt films was influenced strongly by the number of repetitions （n） of CoPt/C. By controlling the C content and the number of repetitions （n） of CoPt/C, nearly perfect （001） orientation can be obtained in the [CoPt3nm/C3nm]5/Ag50 nm.展开更多
FePt/Ag thin films were deposited by magnetron sputtering onto 7059 glass substrates, then were annealed at 550 ℃ for 30 min. Nanostructured FePt/Ag films were successfully obtained with the magnetic easy axis of L10...FePt/Ag thin films were deposited by magnetron sputtering onto 7059 glass substrates, then were annealed at 550 ℃ for 30 min. Nanostructured FePt/Ag films were successfully obtained with the magnetic easy axis of L10 FePt perpendicular to the film plane. It was found that the development of （001） texture depended strongly on the thicknesses of FePt magnetic layer and Ag underlayer. The L10 ordered FePt（15 nm）/Ag（50 nm） with （001） orientation can be obtained. And the perpendicular coercivity of FePt（15 nm）/Ag（50 nm） film reached to 7.2× 10^5 A/m, whereas the longitudinal one was only 3.2×10^4 A/m. The non-magnetic Ag underlayer can not only induce （001） orientation and ordering of FePt grains, but also reduce the intergrain interactions.展开更多
By selecting flexible polycrystalline Ag as the metallic substrates, highly c axis (001) textured YBCO thin films were fabricated by using a modified magnetron sputtering equipment which can accomplish dynamic de...By selecting flexible polycrystalline Ag as the metallic substrates, highly c axis (001) textured YBCO thin films were fabricated by using a modified magnetron sputtering equipment which can accomplish dynamic deposition and in-situ anneal treatment. The textures of Ag substrates have important effects on forming YBCO films with high critical current densities. Research on the textures of cold rolling Ag at different deformation degrees and recrystallization textures of Ag at different temperatures shows that in plane alignment of YBCO films is difficult to be obtained directly on cold rolling Ag substrates, because of the texture change of Ag during deposition heating of substrates and the strong dependence of J c of YBCO films on grain boundary misorientation angle of substrates. The recrystallization textures with cube (001) and rotated cube (001) in Ag were obtained. Experiments offer a possible prospect for the further research of fabricating sharp biaxially texture in Ag and the following deposition of high J c YBCO films directly on it.展开更多
The Al-Mg-Mn alloy sheets with and without trace Sc and Zr were investigated by means of tensile test,X-ray diffraction,optical microscope,and transmission electron microscope.The indexes of in-plane anisotropy(IIPA)o...The Al-Mg-Mn alloy sheets with and without trace Sc and Zr were investigated by means of tensile test,X-ray diffraction,optical microscope,and transmission electron microscope.The indexes of in-plane anisotropy(IIPA)of their tensile mechanical properties were calculated and their inverse pole figures were obtained by Harris method.The two alloy sheets have the same law of in-plane anisotropy and remarkable in-plane anisotropy of mechanical properties,and the IIPA of the alloy sheet with Sc and Zr is bigger than that of the alloy sheet without Sc and Zr.The relationships of the in-plane anisotropy and the anisotropy of the crystallographic texture were analyzed based on the model of monocrystal.It is the common action of the anisotropy of crystallography and microstructures that causes the in-plane anisotropy of their mechanical properties,but the major cause is the{110}〈112〉crystallographic texture.The trace Sc and Zr can promote the formation and stabilization of the{110}〈112〉texture,inhibit the formation of the{100}〈001〉texture,and increase the in-plane anisotropy of the alloy sheet containing trace Sc and Zr.展开更多
[SiO2/FePt]5/Ag thin films were deposited by RF magnetron sputtering on the glass substrates and post annealing at 550 ℃ for 30 min in vacuum. Vibrating sample magnetometer and X-ray diffraction analyser were applied...[SiO2/FePt]5/Ag thin films were deposited by RF magnetron sputtering on the glass substrates and post annealing at 550 ℃ for 30 min in vacuum. Vibrating sample magnetometer and X-ray diffraction analyser were applied to study the magnetic properties and microstructures of the films. The results show that without Ag underlayer [SiO2/FePt]5 films deposited onto the glass are FCC disordered; with the addition of Ag underlayer [SiO]FePt]5/Ag films are changed into L10 and （111） mixed texture. The variation of the SiO2 nonmagnetic layer thickness in [SiO2/FePt]5/Ag films indicates that SiO2-doping plays an important role in improving the order parameter and the perpendicular magnetic anisotropy, and reducing the grain size and intergrain interactions. By controlling SiO2 thickness the highly perpendicular magnetic anisotropy can be obtained in the [SiO2 （0.6 nm）/FePt （3 nm）]5/Ag （50 nm） films and highly （001）-oriented films can be obtained in the [SiO2 （2 nm）/FePt （3 nm）]5/Ag （50 nm） films.展开更多
A high-performance PMOSFET based on silicon material of hybrid orientation is obtained.Hybrid orientation wafers,integrated by（100） and（110） crystal orientation,are fabricated using silicon-silicon bonding, chemic...A high-performance PMOSFET based on silicon material of hybrid orientation is obtained.Hybrid orientation wafers,integrated by（100） and（110） crystal orientation,are fabricated using silicon-silicon bonding, chemical mechanical polishing,etching silicon and non-selective expitaxy.A PMOSFET with W/L = 50μm/8μm is also processed,and the measured results show that the drain-source current and peak mobility of the PMOSFET are enhanced by up to 50.7%and 150%at V_（gs） =-15 V and V_（ds） =-0.5 V,respectively.The mobility values are higher than that reported in the literature.展开更多
Two types of 5μm thick hybrid orientation structure wafers,which were integrated by（110）or（100） orientation silicon wafers as the substrate,have been investigated for 15-40 V voltage ICs and MEMS sensor applicati...Two types of 5μm thick hybrid orientation structure wafers,which were integrated by（110）or（100） orientation silicon wafers as the substrate,have been investigated for 15-40 V voltage ICs and MEMS sensor applications.They have been obtained mainly by SOI wafer bonding and a non-selective epitaxy technique,and have been presented in China for the first time.The thickness of BOX SiO2 buried in wafer is 220 nm.It has been found that the quality of hybrid orientation structure with（100）wafer substrate is better than that with（110）wafer substrate by＂Sirtl defect etching of HOSW＂.展开更多
基金Project(0208) supported by the Science and Technology Research of Ministry of Education of China
文摘The texture evolution and lattice rotation in Al alloy 6111 with an initial {001} <110> component during symmetrical and asymmetrical rolling were investigated by means of orientation distribution function(ODF). The results show that the as-rolled initial {001}<110 > entation evolves into not only the copper orientation but also all the other orientations along the β fiber, including the brass orientation, by lattice rotation around special directions. Compared with the symmetrical rolling, the {001}<110 > component in the surface layer on the slower roller side evolves more quickly into the orientations along the β fiber during asymmetrical rolling, while that in the surface layer on the faster roller side evolves more slowly.
基金This work was financially supported by the National Natural Science Foundation of China (No. 10574085) and the Natural Science Foundation of Shanxi Province, China (No. 20041032)
文摘The highly （1301） oriented triple system of [CoPt/C]n/Ag films was deposited on glass substrates by DC and RF magnetron sputtering. After annealing at 600℃ for 30 min, thin films become magnetically hard with coercivities in the range of 160-875 kA/m because of high anisotropy associated with the L10 ordered phase. C doping plays an important role in improving （001） texture and reducing the intergrain interactions. The oriented growth of CoPt films was influenced strongly by the number of repetitions （n） of CoPt/C. By controlling the C content and the number of repetitions （n） of CoPt/C, nearly perfect （001） orientation can be obtained in the [CoPt3nm/C3nm]5/Ag50 nm.
文摘FePt/Ag thin films were deposited by magnetron sputtering onto 7059 glass substrates, then were annealed at 550 ℃ for 30 min. Nanostructured FePt/Ag films were successfully obtained with the magnetic easy axis of L10 FePt perpendicular to the film plane. It was found that the development of （001） texture depended strongly on the thicknesses of FePt magnetic layer and Ag underlayer. The L10 ordered FePt（15 nm）/Ag（50 nm） with （001） orientation can be obtained. And the perpendicular coercivity of FePt（15 nm）/Ag（50 nm） film reached to 7.2× 10^5 A/m, whereas the longitudinal one was only 3.2×10^4 A/m. The non-magnetic Ag underlayer can not only induce （001） orientation and ordering of FePt grains, but also reduce the intergrain interactions.
文摘By selecting flexible polycrystalline Ag as the metallic substrates, highly c axis (001) textured YBCO thin films were fabricated by using a modified magnetron sputtering equipment which can accomplish dynamic deposition and in-situ anneal treatment. The textures of Ag substrates have important effects on forming YBCO films with high critical current densities. Research on the textures of cold rolling Ag at different deformation degrees and recrystallization textures of Ag at different temperatures shows that in plane alignment of YBCO films is difficult to be obtained directly on cold rolling Ag substrates, because of the texture change of Ag during deposition heating of substrates and the strong dependence of J c of YBCO films on grain boundary misorientation angle of substrates. The recrystallization textures with cube (001) and rotated cube (001) in Ag were obtained. Experiments offer a possible prospect for the further research of fabricating sharp biaxially texture in Ag and the following deposition of high J c YBCO films directly on it.
基金This work was financially supported by the National Key Fundamental Research Development Program(No.G1999064911).
文摘The Al-Mg-Mn alloy sheets with and without trace Sc and Zr were investigated by means of tensile test,X-ray diffraction,optical microscope,and transmission electron microscope.The indexes of in-plane anisotropy(IIPA)of their tensile mechanical properties were calculated and their inverse pole figures were obtained by Harris method.The two alloy sheets have the same law of in-plane anisotropy and remarkable in-plane anisotropy of mechanical properties,and the IIPA of the alloy sheet with Sc and Zr is bigger than that of the alloy sheet without Sc and Zr.The relationships of the in-plane anisotropy and the anisotropy of the crystallographic texture were analyzed based on the model of monocrystal.It is the common action of the anisotropy of crystallography and microstructures that causes the in-plane anisotropy of their mechanical properties,but the major cause is the{110}〈112〉crystallographic texture.The trace Sc and Zr can promote the formation and stabilization of the{110}〈112〉texture,inhibit the formation of the{100}〈001〉texture,and increase the in-plane anisotropy of the alloy sheet containing trace Sc and Zr.
基金Project(10574085) supported by the National Natural Science Foundation of ChinaProject(207020) supported by the Science Technology Key Project of the Ministry of Education, China
文摘[SiO2/FePt]5/Ag thin films were deposited by RF magnetron sputtering on the glass substrates and post annealing at 550 ℃ for 30 min in vacuum. Vibrating sample magnetometer and X-ray diffraction analyser were applied to study the magnetic properties and microstructures of the films. The results show that without Ag underlayer [SiO2/FePt]5 films deposited onto the glass are FCC disordered; with the addition of Ag underlayer [SiO]FePt]5/Ag films are changed into L10 and （111） mixed texture. The variation of the SiO2 nonmagnetic layer thickness in [SiO2/FePt]5/Ag films indicates that SiO2-doping plays an important role in improving the order parameter and the perpendicular magnetic anisotropy, and reducing the grain size and intergrain interactions. By controlling SiO2 thickness the highly perpendicular magnetic anisotropy can be obtained in the [SiO2 （0.6 nm）/FePt （3 nm）]5/Ag （50 nm） films and highly （001）-oriented films can be obtained in the [SiO2 （2 nm）/FePt （3 nm）]5/Ag （50 nm） films.
基金supported by the National Basic Research Program of China(No.61398)
文摘A high-performance PMOSFET based on silicon material of hybrid orientation is obtained.Hybrid orientation wafers,integrated by（100） and（110） crystal orientation,are fabricated using silicon-silicon bonding, chemical mechanical polishing,etching silicon and non-selective expitaxy.A PMOSFET with W/L = 50μm/8μm is also processed,and the measured results show that the drain-source current and peak mobility of the PMOSFET are enhanced by up to 50.7%and 150%at V_（gs） =-15 V and V_（ds） =-0.5 V,respectively.The mobility values are higher than that reported in the literature.
基金Project supported by the National Basic Research Program of China(No61398)the National Laboratory of Analog Integrated Circuits Foundation of China(NoYZ0808)
文摘Two types of 5μm thick hybrid orientation structure wafers,which were integrated by（110）or（100） orientation silicon wafers as the substrate,have been investigated for 15-40 V voltage ICs and MEMS sensor applications.They have been obtained mainly by SOI wafer bonding and a non-selective epitaxy technique,and have been presented in China for the first time.The thickness of BOX SiO2 buried in wafer is 220 nm.It has been found that the quality of hybrid orientation structure with（100）wafer substrate is better than that with（110）wafer substrate by＂Sirtl defect etching of HOSW＂.
