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Study of hybrid orientation structure wafer
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作者 谭开洲 张静 +4 位作者 徐世六 张正璠 杨永晖 陈俊 梁涛 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2011年第6期21-23,共3页
Two types of 5μm thick hybrid orientation structure wafers,which were integrated by(110)or(100) orientation silicon wafers as the substrate,have been investigated for 15-40 V voltage ICs and MEMS sensor applicati... Two types of 5μm thick hybrid orientation structure wafers,which were integrated by(110)or(100) orientation silicon wafers as the substrate,have been investigated for 15-40 V voltage ICs and MEMS sensor applications.They have been obtained mainly by SOI wafer bonding and a non-selective epitaxy technique,and have been presented in China for the first time.The thickness of BOX SiO2 buried in wafer is 220 nm.It has been found that the quality of hybrid orientation structure with(100)wafer substrate is better than that with(110)wafer substrate by"Sirtl defect etching of HOSW". 展开更多
关键词 HOT SOI (110)crystal orientation 15-40 v ics MEMS sensor
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