废电解铝阳极碳块经过高温碳化,通过盐酸-硝酸-高氯酸三酸溶解完全后,冷却,完全溶解盐类加入10 mL 1.19 g/mL的盐酸,在优选出最优的仪器工作状态下,创建了ICP-AES法测定废电解铝阳极碳块样品中Fe、Li、K、Ca、Mg的化学分析方法。每个元...废电解铝阳极碳块经过高温碳化,通过盐酸-硝酸-高氯酸三酸溶解完全后,冷却,完全溶解盐类加入10 mL 1.19 g/mL的盐酸,在优选出最优的仪器工作状态下,创建了ICP-AES法测定废电解铝阳极碳块样品中Fe、Li、K、Ca、Mg的化学分析方法。每个元素的校准曲线相关系数均大于0.999,同时对以上多种元素进行检出限、加标回收试验研究,结果表明其相对标准偏差(n=8)为0.60%~2.24%,加标回收率在97.1%~104%。展开更多
Auger Electron Spectroscopy (AES) and Electron Energy Loss Spectroscopy (EELS) have been performed in order to investigate the InP(100) surface subjected to ions bombardment. The InP(100) surface is always contaminate...Auger Electron Spectroscopy (AES) and Electron Energy Loss Spectroscopy (EELS) have been performed in order to investigate the InP(100) surface subjected to ions bombardment. The InP(100) surface is always contaminated by carbon and oxygen revealed by C-KLL and O-KLL AES spectra recorded just after introduction of the sample in the UHV spectrometer chamber. The usually cleaning process of the surface is the bombardment by argon ions. However, even at low energy of ions beam (300 eV) indium clusters and phosphorus vacancies are usually formed on the surface. The aim of our study is to compare the behaviour of the surface when submitted to He+ or H+ ions bombardment. The helium ions accelerated at 500 V voltage and for 45 mn allow removing contaminants but induces damaged and no stoichiometric surface. The proton ions were accelerated at low energy of 500 eV to bombard the InP surface at room temperature. The proton ions broke the In-P chemical bonds to induce the formation of In metal islands. Such a chemical reactivity between hydrogen and phosphorus led to form chemical species such as PH and PH3, which desorbed from the surface. The chemical susceptibly and the small size of H+ advantaged their diffusion into bulk. Since the experimental methods alone were not able to give us with accuracy the disturbed depth of the target by these ions. We associate to the AES and EELS spectroscopies, the TRIM (Transport and Range of Ions in Matter) simulation method in order to show the mechanism of interaction between Ar+, He+ or H+ ions and InP and determine the disturbed depth of the target by argon, helium or proton ions.展开更多
针对传统通用串行总线(Universal Serial Bus,USB)接口数据安全传输方法存在丢包率较高的问题,提出基于高级加密标准(Advanced Encryption Standard,AES)的USB接口数据安全传输方法。首先,对读取的数据进行AES加密,并通过计算形成单向函...针对传统通用串行总线(Universal Serial Bus,USB)接口数据安全传输方法存在丢包率较高的问题,提出基于高级加密标准(Advanced Encryption Standard,AES)的USB接口数据安全传输方法。首先,对读取的数据进行AES加密,并通过计算形成单向函数;其次,检验发送的加密数据,确保无加密传输错误或安全风险;最后,设计对比实验。实验结果表明,与传统传输方法相比,该方法的丢包率更低。展开更多
文摘废电解铝阳极碳块经过高温碳化,通过盐酸-硝酸-高氯酸三酸溶解完全后,冷却,完全溶解盐类加入10 mL 1.19 g/mL的盐酸,在优选出最优的仪器工作状态下,创建了ICP-AES法测定废电解铝阳极碳块样品中Fe、Li、K、Ca、Mg的化学分析方法。每个元素的校准曲线相关系数均大于0.999,同时对以上多种元素进行检出限、加标回收试验研究,结果表明其相对标准偏差(n=8)为0.60%~2.24%,加标回收率在97.1%~104%。
文摘Auger Electron Spectroscopy (AES) and Electron Energy Loss Spectroscopy (EELS) have been performed in order to investigate the InP(100) surface subjected to ions bombardment. The InP(100) surface is always contaminated by carbon and oxygen revealed by C-KLL and O-KLL AES spectra recorded just after introduction of the sample in the UHV spectrometer chamber. The usually cleaning process of the surface is the bombardment by argon ions. However, even at low energy of ions beam (300 eV) indium clusters and phosphorus vacancies are usually formed on the surface. The aim of our study is to compare the behaviour of the surface when submitted to He+ or H+ ions bombardment. The helium ions accelerated at 500 V voltage and for 45 mn allow removing contaminants but induces damaged and no stoichiometric surface. The proton ions were accelerated at low energy of 500 eV to bombard the InP surface at room temperature. The proton ions broke the In-P chemical bonds to induce the formation of In metal islands. Such a chemical reactivity between hydrogen and phosphorus led to form chemical species such as PH and PH3, which desorbed from the surface. The chemical susceptibly and the small size of H+ advantaged their diffusion into bulk. Since the experimental methods alone were not able to give us with accuracy the disturbed depth of the target by these ions. We associate to the AES and EELS spectroscopies, the TRIM (Transport and Range of Ions in Matter) simulation method in order to show the mechanism of interaction between Ar+, He+ or H+ ions and InP and determine the disturbed depth of the target by argon, helium or proton ions.
文摘针对传统通用串行总线(Universal Serial Bus,USB)接口数据安全传输方法存在丢包率较高的问题,提出基于高级加密标准(Advanced Encryption Standard,AES)的USB接口数据安全传输方法。首先,对读取的数据进行AES加密,并通过计算形成单向函数;其次,检验发送的加密数据,确保无加密传输错误或安全风险;最后,设计对比实验。实验结果表明,与传统传输方法相比,该方法的丢包率更低。
