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Precisely controlling the twist angle of epitaxial MoS_(2)/graphene heterostructure by AFM tip manipulation
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作者 Jiahao Yuan Mengzhou Liao +7 位作者 Zhiheng Huang Jinpeng Tian Yanbang Chu Luojun Du Wei Yang Dongxia Shi Rong Yang Guangyu Zhang 《Chinese Physics B》 SCIE EI CAS CSCD 2022年第8期173-177,共5页
Two-dimensional(2D)moirématerials have attracted a lot of attention and opened a new research frontier of twistronics due to their novel physical properties.Although great progress has been achieved,the inability... Two-dimensional(2D)moirématerials have attracted a lot of attention and opened a new research frontier of twistronics due to their novel physical properties.Although great progress has been achieved,the inability to precisely and reproducibly manipulate the twist angle hinders the further development of twistronics.Here,we demonstrated an atomic force microscope(AFM)tip manipulation method to control the interlayer twist angle of epitaxial MoS_(2)/graphene heterostructure with an ultra-high accuracy better than 0.1°.Furthermore,conductive AFM and spectroscopic characterizations were conducted to show the effects of the twist angle on moirépattern wavelength,phonons and excitons.Our work provides a technique to precisely control the twist angle of 2D moirématerials,enabling the possibility to establish the phase diagrams of moiréphysics with twist angle. 展开更多
关键词 afm tip manipulation MoS_(2)/graphene heterostructure twist angle moirésuperlattice
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