An all-optical analog-to-digital converter （ADC） based on the nonlinear effect in a silicon waveguide is a promising candidate for overcoming the limitation of electronic devices and is suitable for photonic integra...An all-optical analog-to-digital converter （ADC） based on the nonlinear effect in a silicon waveguide is a promising candidate for overcoming the limitation of electronic devices and is suitable for photonic integration. In this paper, a lumped time-delay compensation scheme with 2-bit quantization resolution is proposed. A strip silicon waveguide is designed and used to compensate for the entire time-delays of the optical pulses after a soliton self-frequency shift （SSFS） module within a wavelength range of 1550 nm-1580 nm. A dispersion coefficient as high as -19800 ps/（km.nm） with ＋0.5 ps/（km.nm） variation is predicted for the strip waveguide. The simulation results show that the maximum supportable sampling rate （MSSR） is 50.45 GSa/s with full width at half maximum （FWHM） variation less than 2.52 ps, along with the 2-bit effective- number-of-bit and Gray code output.展开更多
A digital background calibration technique that corrects the capacitor mismatches error is proposed for successive approximation register analog-to-digital converter (SAR ADC). The technique is implemented in SAR ADC ...A digital background calibration technique that corrects the capacitor mismatches error is proposed for successive approximation register analog-to-digital converter (SAR ADC). The technique is implemented in SAR ADC which is based on tri-level switching. The termination capacitor in the Digital-to-Analog Converter (DAC) is regarded as a reference capacitor and the digital weights of all other unit capacitors are corrected with respect to the reference capacitor. To make a comparison between the size of the unit capacitor and that of the reference capacitor, each input sample is quantized twice. The unit capacitor being calibrated is swapped with the reference capacitor during the second conversion. The difference between the two conversion results is used to correct the digital weight of the unit capacitor under calibration. The calibration technique with two reference capacitors is presented to reduce the number of parameters to be estimated. Behavior simulation is performed to verify the proposed calibration technique by using a 12-bit SAR ADC with 3% random capacitor mismatch. The simulation results show that the Signal-to-Noise and Distortion Ratio (SNDR) is improved from 57.2 dB to 72.2 dB and the Spurious Free Dynamic Range (SFDR) is improved from 60.0 dB to 85.4 dB.展开更多
A new technique which is named charge temporary storage technique (CTST) was presented to improve the linearity of a 1.5 bit/s pipelined analog-to-digital converter (ADC). The residual voltage was obtained from the sa...A new technique which is named charge temporary storage technique (CTST) was presented to improve the linearity of a 1.5 bit/s pipelined analog-to-digital converter (ADC). The residual voltage was obtained from the sampling capacitor, and the other capacitor was just a temporary storage of charge. Then, the linearity produced by the mismatch of these capacitors was eliminated without adding extra capacitor error-averaging amplifiers. The simulation results confirmed the high linearity and low dissipation of pipelined ADCs implemented in CTST, so CTST was a new method to implement high resolution, small size ADCs.展开更多
A low-power 14-bit 150MS/s an- alog-to-digital converter （ADC） is present- ed for communication applications. Range scaling enables a maximal 2-Vp-p input with a single-stage opamp adopted. Opamp and capacitor shari...A low-power 14-bit 150MS/s an- alog-to-digital converter （ADC） is present- ed for communication applications. Range scaling enables a maximal 2-Vp-p input with a single-stage opamp adopted. Opamp and capacitor sharing between the first multi- plying digital-to-analog converter （MDAC） and the second one reduces the total opamp power further. The dedicated sample-and- hold amplifier （SHA） is removed to lower the power and the noise. The blind calibration of linearity errors is proposed to improve the per- formance. The prototype ADC is fabricated in a 130rim CMOS process with a 1.3-V supply voltage. The SNDR of the ADC is 71.3 dB with a 2.4 MHz input and remains 68.5 dB for a 120 MHz input. It consumes 85 roW, which includes 57 mW for the ADC core, 11 mW for the low jitter clock receiver and 17 mW for the high-speed reference buffer.展开更多
基金supported by the Fundamental Research Funds for the Central Universities,China(Grant No.FRF-TP-15-030A1)China Postdoctoral Science Foundation(Grant No.2015M580978)
文摘An all-optical analog-to-digital converter （ADC） based on the nonlinear effect in a silicon waveguide is a promising candidate for overcoming the limitation of electronic devices and is suitable for photonic integration. In this paper, a lumped time-delay compensation scheme with 2-bit quantization resolution is proposed. A strip silicon waveguide is designed and used to compensate for the entire time-delays of the optical pulses after a soliton self-frequency shift （SSFS） module within a wavelength range of 1550 nm-1580 nm. A dispersion coefficient as high as -19800 ps/（km.nm） with ＋0.5 ps/（km.nm） variation is predicted for the strip waveguide. The simulation results show that the maximum supportable sampling rate （MSSR） is 50.45 GSa/s with full width at half maximum （FWHM） variation less than 2.52 ps, along with the 2-bit effective- number-of-bit and Gray code output.
文摘A digital background calibration technique that corrects the capacitor mismatches error is proposed for successive approximation register analog-to-digital converter (SAR ADC). The technique is implemented in SAR ADC which is based on tri-level switching. The termination capacitor in the Digital-to-Analog Converter (DAC) is regarded as a reference capacitor and the digital weights of all other unit capacitors are corrected with respect to the reference capacitor. To make a comparison between the size of the unit capacitor and that of the reference capacitor, each input sample is quantized twice. The unit capacitor being calibrated is swapped with the reference capacitor during the second conversion. The difference between the two conversion results is used to correct the digital weight of the unit capacitor under calibration. The calibration technique with two reference capacitors is presented to reduce the number of parameters to be estimated. Behavior simulation is performed to verify the proposed calibration technique by using a 12-bit SAR ADC with 3% random capacitor mismatch. The simulation results show that the Signal-to-Noise and Distortion Ratio (SNDR) is improved from 57.2 dB to 72.2 dB and the Spurious Free Dynamic Range (SFDR) is improved from 60.0 dB to 85.4 dB.
基金The National Science Fund for Creative Re-search Groups( Grant No 60521002 )Shanghai Natural Science Foundation (GrantNo 037062022)
文摘A new technique which is named charge temporary storage technique (CTST) was presented to improve the linearity of a 1.5 bit/s pipelined analog-to-digital converter (ADC). The residual voltage was obtained from the sampling capacitor, and the other capacitor was just a temporary storage of charge. Then, the linearity produced by the mismatch of these capacitors was eliminated without adding extra capacitor error-averaging amplifiers. The simulation results confirmed the high linearity and low dissipation of pipelined ADCs implemented in CTST, so CTST was a new method to implement high resolution, small size ADCs.
基金supported by the Major National Science & Technology Program of China under Grant No.2012ZX03004004-002National High Technology Research and Development Program of China under Grant No. 2013AA014302
文摘A low-power 14-bit 150MS/s an- alog-to-digital converter （ADC） is present- ed for communication applications. Range scaling enables a maximal 2-Vp-p input with a single-stage opamp adopted. Opamp and capacitor sharing between the first multi- plying digital-to-analog converter （MDAC） and the second one reduces the total opamp power further. The dedicated sample-and- hold amplifier （SHA） is removed to lower the power and the noise. The blind calibration of linearity errors is proposed to improve the per- formance. The prototype ADC is fabricated in a 130rim CMOS process with a 1.3-V supply voltage. The SNDR of the ADC is 71.3 dB with a 2.4 MHz input and remains 68.5 dB for a 120 MHz input. It consumes 85 roW, which includes 57 mW for the ADC core, 11 mW for the low jitter clock receiver and 17 mW for the high-speed reference buffer.
