To explore ways to improve the accuracy of quantitative analysis of samples in the micrometer to nanometer range of magnitudes,we adopted analytical transmission electron microscopy(AEM/EDS)for qualitative and quantit...To explore ways to improve the accuracy of quantitative analysis of samples in the micrometer to nanometer range of magnitudes,we adopted analytical transmission electron microscopy(AEM/EDS)for qualitative and quantitative analysis of pyrite materials.Additionally,the k factor of pyrite is calculated experimentally.To develop an appropriate non-standard quantitative analysis model for pyrite materials,the experimentally calculated k factor is compared with that estimated from the non-standard quantitative analytical model of the instrument software.The experimental findings demonstrate that the EDS attached to a TEM can be employed for precise quantitative analysis of micro-and nanoscale regions of pyrite materials.Furthermore,it serves as a reference for improving the results of the EDS quantitative analysis of other sulfides.展开更多
Microstructure of SiC fiber manufactured by chemical vapor deposition （CVD） onto tungsten （W） wire core was investigated by analytical electron microscopy （AEM）. The results reveal that the fiber consists of W c...Microstructure of SiC fiber manufactured by chemical vapor deposition （CVD） onto tungsten （W） wire core was investigated by analytical electron microscopy （AEM）. The results reveal that the fiber consists of W core, SiC sheath and C-coating. SiC sheath could be subdivided into two parts according to whether containing C rich stripe, or not. An emphasis was put on W/SiC interfacial reaction products and the transition zone between sub-layers in SiC sheath. The W/SiC interface consists of three layers of reaction production, namely, W2C, W5Si3 and WC. And there are amounts of facet faults existing in （100） face of WC crystalline and two classes of stack faults in WC have been revealed. The formation essence of different sublayers in SiC sheath was also discussed.展开更多
基金Funded by the International Science&Technology Cooperation Program of Hubei Province of China(No.2022EHB024)。
文摘To explore ways to improve the accuracy of quantitative analysis of samples in the micrometer to nanometer range of magnitudes,we adopted analytical transmission electron microscopy(AEM/EDS)for qualitative and quantitative analysis of pyrite materials.Additionally,the k factor of pyrite is calculated experimentally.To develop an appropriate non-standard quantitative analysis model for pyrite materials,the experimentally calculated k factor is compared with that estimated from the non-standard quantitative analytical model of the instrument software.The experimental findings demonstrate that the EDS attached to a TEM can be employed for precise quantitative analysis of micro-and nanoscale regions of pyrite materials.Furthermore,it serves as a reference for improving the results of the EDS quantitative analysis of other sulfides.
文摘Microstructure of SiC fiber manufactured by chemical vapor deposition （CVD） onto tungsten （W） wire core was investigated by analytical electron microscopy （AEM）. The results reveal that the fiber consists of W core, SiC sheath and C-coating. SiC sheath could be subdivided into two parts according to whether containing C rich stripe, or not. An emphasis was put on W/SiC interfacial reaction products and the transition zone between sub-layers in SiC sheath. The W/SiC interface consists of three layers of reaction production, namely, W2C, W5Si3 and WC. And there are amounts of facet faults existing in （100） face of WC crystalline and two classes of stack faults in WC have been revealed. The formation essence of different sublayers in SiC sheath was also discussed.
