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H-Beam Stripping Loss at Background Partial Pressure of Ar
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作者 胡纯栋 王绍虎 胡立群 《Plasma Science and Technology》 SCIE EI CAS CSCD 2005年第6期3105-3106,共2页
It has been observed that H^- current could be improved by adding Ar to H2 plasma. But due to a slower pumping speed for Ar with the existing pumping scheme, the tank pressure will increase quickly during the length o... It has been observed that H^- current could be improved by adding Ar to H2 plasma. But due to a slower pumping speed for Ar with the existing pumping scheme, the tank pressure will increase quickly during the length of a beam pulse. Since H^- stripping loss depends on the tank pressure and gas species, part of the H^- beam can be converted to H^0 and then H^0 can be converted into H^+ with background H2 and Ar gas thickness. Therefore, the H^- beam current, measured by a Faraday cup, situated at a distance L from GG (ground grid), will decrease because it will be converted into a H^+ current. This gives a ratio of the Faraday cup net current to the H^- beam current before stripping at background partial pressure of Ar. 展开更多
关键词 H^- beam stripping loss ar gas thickness
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Dry etching of new phase-change material Al_(1.3)Sb_3Te in CF_4/Ar plasma
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作者 张徐 饶峰 +10 位作者 刘波 彭程 周夕淋 姚栋宁 郭晓慧 宋三年 王良咏 成岩 吴良才 宋志棠 封松林 《Journal of Semiconductors》 EI CAS CSCD 2012年第10期10-15,共6页
The dry etching characteristic of AlSbTe film was investigated by using a CF/Ar gas mixture.The experimental control parameters were gas flow rate into the chamber,CF/Ar ratio,the Oaddition,the chamber background pres... The dry etching characteristic of AlSbTe film was investigated by using a CF/Ar gas mixture.The experimental control parameters were gas flow rate into the chamber,CF/Ar ratio,the Oaddition,the chamber background pressure,and the incident RF power applied to the lower electrode.The total flow rate was 50 sccm and the behavior of etch rate of AlSbTe thin films was investigated as a function of the CF/Ar ratio,the Oaddition,the chamber background pressure,and the incident RF power.Then the parameters were optimized.The fast etch rate was up to 70.8 nm/min and a smooth surface was achieved using optimized etching parameters of CFconcentration of 4%,power of 300 W and pressure of 80 mTorr. 展开更多
关键词 Al1.3Sb3Te dry etching CF4/ar gas mixture etch rate
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