Effects of performing an R-factor analysis of observed variables based on population models comprising R- and Q-factors were investigated. Although R-factor analysis of data based on a population model comprising R- a...Effects of performing an R-factor analysis of observed variables based on population models comprising R- and Q-factors were investigated. Although R-factor analysis of data based on a population model comprising R- and Q-factors is possible, this may lead to model error. Accordingly, loading estimates resulting from R-factor analysis of sample data drawn from a population based on a combination of R- and Q-factors will be biased. It was shown in a simulation study that a large amount of Q-factor variance induces an increase in the variation of R-factor loading estimates beyond the chance level. Tests of the multivariate kurtosis of observed variables are proposed as an indicator of possible Q-factor variance in observed variables as a prerequisite for R-factor analysis.展开更多
Cyber threats and risks are increasing exponentially with time. For preventing and defense against these threats and risks, precise risk perception for effective mitigation is the first step. Risk perception is necess...Cyber threats and risks are increasing exponentially with time. For preventing and defense against these threats and risks, precise risk perception for effective mitigation is the first step. Risk perception is necessary requirement to mitigate risk as it drives the security strategy at the organizational level and human attitude at individual level. Sometime, individuals understand there is a risk that a negative event or incident can occur, but they do not believe there will be a personal impact if the risk comes to realization but instead, they believe that the negative event will impact others. This belief supports the common belief that individuals tend to think of themselves as invulnerable, i.e., optimistically bias about the situation, thus affecting their attitude for taking preventive measures due to inappropriate risk perception or overconfidence. The main motivation of this meta-analysis is to assess that how the cyber optimistic bias or cyber optimism bias affects individual’s cyber security risk perception and how it changes their decisions. Applying a meta-analysis, this study found that optimistic bias has an overall negative impact on the cyber security due to the inappropriate risk perception and considering themselves invulnerable by biasing that the threat will not occur to them. Due to the cyber optimism bias, the individual will sometimes share passwords by considering it will not be maliciously used, lack in adopting of preventive measures, ignore security incidents, wrong perception of cyber threats and overconfidence on themselves in the context of cyber security.展开更多
In this paper, firstly, the bias between observed radiances from the Advanced TIROS-N Operational Vertical Sounder （ATOVS） and those simulated from a model first-guess are corrected. After bias correction, the obser...In this paper, firstly, the bias between observed radiances from the Advanced TIROS-N Operational Vertical Sounder （ATOVS） and those simulated from a model first-guess are corrected. After bias correction, the observed minus calculated （O-B） radiances of most channels were reduced closer to zero, with peak values in each channel shifted towards zero, and the distribution of O-B closer to a Gaussian distribution than without bias correction. Secondly, ATOVS radiance data with and without bias correction are assimilated directly with an Ensemble Kalman Filter （EnKF） data assimilation system, which are then adopted as the initial fields in the forecast model T106L19 to simulate Typhoon Prapiroon （2006） during the period 2-4 August 2006. The prediction results show that the assimilation of ATOVS radiance data with bias correction has a significant and positive impact upon the prediction of the typhoon＇s track and intensity, although the results are not perfect.展开更多
为了提升便携式近红外仪器中单一水果模型应用的广泛性,创新性的将不同仪器间模型传递的思想应用在不同种类水果间可溶性固形物(soluble solid content,SSC)的模型传递。基于苹果、梨、桃三种水果在SSC含量范围、果型大小以及果皮厚度...为了提升便携式近红外仪器中单一水果模型应用的广泛性,创新性的将不同仪器间模型传递的思想应用在不同种类水果间可溶性固形物(soluble solid content,SSC)的模型传递。基于苹果、梨、桃三种水果在SSC含量范围、果型大小以及果皮厚度等的相近物理化学特性,提出利用简单的斜率/截距(Slope/Bias)算法对苹果SSC的偏最小二乘(partial least square,PLS)模型进行传递,仅用少量的梨和桃样品即可将苹果SSC模型应用于其SSC值的预测,更快捷方便且节约成本。对于梨样品,用35个标准样品,预测集均方根误差(root mean square error of prediction,RMSEP)值由直接预测的1.009°Brix降为0.565°Brix;对于桃样品,用40个标准样品,RMSEP由直接预测的1.726°Brix降为0.677°Brix。为了验证该模型传递方法的可行性,通过斜率/截距算法,采用梨和桃模型对其他两种水果的SSC进行预测,其中利用建立的梨SSC模型,经斜率/截距算法模型传递后,对于苹果样品,用30个标准样品,RMSEP值达到0.597°Brix,对于桃样品,用40个标准样品,RMSEP值达到0.689°Brix;利用建立的桃SSC模型,经斜率/截距算法模型传递后,对于苹果样品,用35个标准样品,RMSEP值达到0.654°Brix,对于梨样品,用30个标准样品,RMSEP值达到0.439°Brix。研究结果表明:斜率/截距(Slope/Bias)方法可用于苹果、梨、桃等相近种类水果间的模型传递,为近红外光谱仪在相似种类物质间的预测提供了新思路。展开更多
This paper studies the effect of drain bias on ultra-short p-channel metal-oxide-semiconductor field-effect transistor （PMOSFET） degradation during negative bias temperature （NBT） stress. When a relatively large g...This paper studies the effect of drain bias on ultra-short p-channel metal-oxide-semiconductor field-effect transistor （PMOSFET） degradation during negative bias temperature （NBT） stress. When a relatively large gate voltage is applied, the degradation magnitude is much more than the drain voltage which is the same as the gate voltage supplied, and the time exponent gets larger than that of the NBT instability （NBTI）. With decreasing drain voltage, the degradation magnitude and the time exponent all get smaller. At some values of the drain voltage, the degradation magnitude is even smaller than that of NBTI, and when the drain voltage gets small enough, the exhibition of degradation becomes very similar to the NBTI degradation. When a relatively large drain voltage is applied, with decreasing gate voltage, the degradation magnitude gets smaller. However, the time exponent becomes larger. With the help of electric field simulation, this paper concludes that the degradation magnitude is determined by the vertical electric field of the oxide, the amount of hot holes generated by the strong channel lateral electric field at the gate/drain overlap region, and the time exponent is mainly controlled by localized damage caused by the lateral electric field of the oxide in the gate/drain overlap region where hot carriers are produced.展开更多
The effect of substrate bias on the degradation during applying a negative bias temperature （NBT） stress is studied in this paper. With a smaller gate voltage stress applied, the degradation of negative bias tempera...The effect of substrate bias on the degradation during applying a negative bias temperature （NBT） stress is studied in this paper. With a smaller gate voltage stress applied, the degradation of negative bias temperature instability （NBTI） is enhanced, and there comes forth an inflexion point. The degradation pace turns larger when the substrate bias is higher than the inflexion point. The substrate hot holes can be injected into oxide and generate additional oxide traps, inducing an inflexion phenomenon. When a constant substrate bias stress is applied, as the gate voltage stress increases, an inflexion comes into being also. The higher gate voltage causes the electrons to tunnel into the substrate from the poly, thereby generating the electro,hole pairs by impact ionization. The holes generated by impact ionization and the holes from the substrate all can be accelerated to high energies by the substrate bias. More additional oxide traps can be produced, and correspondingly, the degradation is strengthened by the substrate bias. The results of the alternate stress experiment show that the interface traps generated by the hot holes cannot be annealed, which is different from those generated by common holes.展开更多
文摘Effects of performing an R-factor analysis of observed variables based on population models comprising R- and Q-factors were investigated. Although R-factor analysis of data based on a population model comprising R- and Q-factors is possible, this may lead to model error. Accordingly, loading estimates resulting from R-factor analysis of sample data drawn from a population based on a combination of R- and Q-factors will be biased. It was shown in a simulation study that a large amount of Q-factor variance induces an increase in the variation of R-factor loading estimates beyond the chance level. Tests of the multivariate kurtosis of observed variables are proposed as an indicator of possible Q-factor variance in observed variables as a prerequisite for R-factor analysis.
基金supported by the National Key Research and Development Program of China[grant number 2020YFA0608000]the National Natural Science Foundation of China[grant number 42075141]+2 种基金the Meteorological Joint Funds of the National Natural Science Foundation of China[grant number U2142211]the Key Project Fund of the Shanghai 2020“Science and Technology Innovation Action Plan”for Social Development[grant number 20dz1200702]the first batch of Model Interdisciplinary Joint Research Projects of Tongji University in 2021[grant number YB-21-202110].
文摘Cyber threats and risks are increasing exponentially with time. For preventing and defense against these threats and risks, precise risk perception for effective mitigation is the first step. Risk perception is necessary requirement to mitigate risk as it drives the security strategy at the organizational level and human attitude at individual level. Sometime, individuals understand there is a risk that a negative event or incident can occur, but they do not believe there will be a personal impact if the risk comes to realization but instead, they believe that the negative event will impact others. This belief supports the common belief that individuals tend to think of themselves as invulnerable, i.e., optimistically bias about the situation, thus affecting their attitude for taking preventive measures due to inappropriate risk perception or overconfidence. The main motivation of this meta-analysis is to assess that how the cyber optimistic bias or cyber optimism bias affects individual’s cyber security risk perception and how it changes their decisions. Applying a meta-analysis, this study found that optimistic bias has an overall negative impact on the cyber security due to the inappropriate risk perception and considering themselves invulnerable by biasing that the threat will not occur to them. Due to the cyber optimism bias, the individual will sometimes share passwords by considering it will not be maliciously used, lack in adopting of preventive measures, ignore security incidents, wrong perception of cyber threats and overconfidence on themselves in the context of cyber security.
基金supported by the Knowledge Innovation Program of the Chinese Academy of Sciences (Grant Nos KZCX2-YW-202 and KZCX2-YW-Q03-3)the Chinese Special Scientific Research Project for Public Interest (Grant No GYHY200906004)
文摘In this paper, firstly, the bias between observed radiances from the Advanced TIROS-N Operational Vertical Sounder （ATOVS） and those simulated from a model first-guess are corrected. After bias correction, the observed minus calculated （O-B） radiances of most channels were reduced closer to zero, with peak values in each channel shifted towards zero, and the distribution of O-B closer to a Gaussian distribution than without bias correction. Secondly, ATOVS radiance data with and without bias correction are assimilated directly with an Ensemble Kalman Filter （EnKF） data assimilation system, which are then adopted as the initial fields in the forecast model T106L19 to simulate Typhoon Prapiroon （2006） during the period 2-4 August 2006. The prediction results show that the assimilation of ATOVS radiance data with bias correction has a significant and positive impact upon the prediction of the typhoon＇s track and intensity, although the results are not perfect.
文摘为了提升便携式近红外仪器中单一水果模型应用的广泛性,创新性的将不同仪器间模型传递的思想应用在不同种类水果间可溶性固形物(soluble solid content,SSC)的模型传递。基于苹果、梨、桃三种水果在SSC含量范围、果型大小以及果皮厚度等的相近物理化学特性,提出利用简单的斜率/截距(Slope/Bias)算法对苹果SSC的偏最小二乘(partial least square,PLS)模型进行传递,仅用少量的梨和桃样品即可将苹果SSC模型应用于其SSC值的预测,更快捷方便且节约成本。对于梨样品,用35个标准样品,预测集均方根误差(root mean square error of prediction,RMSEP)值由直接预测的1.009°Brix降为0.565°Brix;对于桃样品,用40个标准样品,RMSEP由直接预测的1.726°Brix降为0.677°Brix。为了验证该模型传递方法的可行性,通过斜率/截距算法,采用梨和桃模型对其他两种水果的SSC进行预测,其中利用建立的梨SSC模型,经斜率/截距算法模型传递后,对于苹果样品,用30个标准样品,RMSEP值达到0.597°Brix,对于桃样品,用40个标准样品,RMSEP值达到0.689°Brix;利用建立的桃SSC模型,经斜率/截距算法模型传递后,对于苹果样品,用35个标准样品,RMSEP值达到0.654°Brix,对于梨样品,用30个标准样品,RMSEP值达到0.439°Brix。研究结果表明:斜率/截距(Slope/Bias)方法可用于苹果、梨、桃等相近种类水果间的模型传递,为近红外光谱仪在相似种类物质间的预测提供了新思路。
基金Project supported by the National Natural Science Foundation of China (Grant Nos. 60736033 and 60376024)the National Key Technology Research and Development Program of the Ministry of Science and Technology of China (Grant No. 2007BAK25B03)
文摘This paper studies the effect of drain bias on ultra-short p-channel metal-oxide-semiconductor field-effect transistor （PMOSFET） degradation during negative bias temperature （NBT） stress. When a relatively large gate voltage is applied, the degradation magnitude is much more than the drain voltage which is the same as the gate voltage supplied, and the time exponent gets larger than that of the NBT instability （NBTI）. With decreasing drain voltage, the degradation magnitude and the time exponent all get smaller. At some values of the drain voltage, the degradation magnitude is even smaller than that of NBTI, and when the drain voltage gets small enough, the exhibition of degradation becomes very similar to the NBTI degradation. When a relatively large drain voltage is applied, with decreasing gate voltage, the degradation magnitude gets smaller. However, the time exponent becomes larger. With the help of electric field simulation, this paper concludes that the degradation magnitude is determined by the vertical electric field of the oxide, the amount of hot holes generated by the strong channel lateral electric field at the gate/drain overlap region, and the time exponent is mainly controlled by localized damage caused by the lateral electric field of the oxide in the gate/drain overlap region where hot carriers are produced.
基金Project supported by the National Natural Science Foundation of China (Grant Nos 60376024,60736033 and 60506020)the National High Technology Research and Development Program of China (Grant No 2003AA1Z1630)
文摘The effect of substrate bias on the degradation during applying a negative bias temperature （NBT） stress is studied in this paper. With a smaller gate voltage stress applied, the degradation of negative bias temperature instability （NBTI） is enhanced, and there comes forth an inflexion point. The degradation pace turns larger when the substrate bias is higher than the inflexion point. The substrate hot holes can be injected into oxide and generate additional oxide traps, inducing an inflexion phenomenon. When a constant substrate bias stress is applied, as the gate voltage stress increases, an inflexion comes into being also. The higher gate voltage causes the electrons to tunnel into the substrate from the poly, thereby generating the electro,hole pairs by impact ionization. The holes generated by impact ionization and the holes from the substrate all can be accelerated to high energies by the substrate bias. More additional oxide traps can be produced, and correspondingly, the degradation is strengthened by the substrate bias. The results of the alternate stress experiment show that the interface traps generated by the hot holes cannot be annealed, which is different from those generated by common holes.
