SPLIT-ADC BASED DIGITAL BACKGROUND CALIBRATION FOR TIME-INTERLEAVED ADC

A novel Time-Interleaved Analog-to-Digital Converter (TIADC) digital background calibration for the mismatches of offsets, gain errors, and timing skews based on split-ADC is proposed. Firstly, the split-ADC channels in present TIADC architecture are designed to convert input signal at two different channel sampling rates so that redundant channel to facilitate pair permutation is avoided. Secondly, a high-order compensation scheme for correction of timing skew error is employed for effective calibration to preserve high-resolution when input frequency is high. Numerical simulation performed by MATLAB for a 14-bit TIADC based on 7 split-ADC channels shows that Signal-to-Noise and Distortion Ratio (SNDR) and Spurious Free Dynamic Range (SFDR) of the TIADC achieve 86.2 dBc and 106 dBc respectively after calibration with normalized input frequency near Nyquist frequency.

A 14-bit 500-MS/s DAC with digital background calibration

Thelinearityofcurrent-steeringdigital-to-analogconverters（DACs）atlowsignalfrequenciesismainly limited by matching properties of current sources, so large-size current source arrays are widely used for better matching. This, however, results in large gradient errors and parasitic capacitance, which degrade the spurious free dynamic range（SFDR） for high-frequency signals. To overcome this problem, calibration is an effective method.In this paper, a digital background calibration technique for current-steering DACs is presented and verified by a 14-bit DAC in a 0.13 m standard CMOS process. The measured differential nonlinearity（DNL） and integral nonlinearity（INL） are 0.4 LSB and 1.2 LSB, respectively. At 500-MS/s, the SFDR is 70 dB and 50.3 dB for signals of 5.4 MHz and 224 MHz, respectively. The core area is 0.69 mm2and the power consumption is 165 mW from a mixed power supply with 1.2 V and 3.3 V.

A 12-bit 100 MS/s pipelined ADC with digital background calibration

This paper presents a 12-bit 100 MS/s CMOS pipelined analog-to-digital converter （ADC） with digital background calibration. A large magnitude calibration signal is injected into the multiplying digital-to-analog converter （MDAC） while the architecture of the MDAC remains unchanged. When sampled at 100 MS/s, it takes only 2.8 s to calibrate the 12-bit prototype ADC and achieves a peak spurious-free dynamic range of 85 dB and a peak signal-to-noise plus distortion ratio of 66 dB with 2 MHz input. Integral nonlinearity is improved from 1.9 to 0.6 least significant bits after calibration. The chip is fabricated in a 0.18μm CMOS process, occupies an active area of 2.3 × 1.6 mm^2, and consumes 205 mW at 1.8 V.

A digital background calibration algorithm of a pipeline ADC based on output code calculation

This paper proposes a digital background calibration algorithm to correct linearity errors in a pipelined analog-to-digital converter（ADC）.The algorithm does not modify the analog circuit of pipelined stages and calibrates the raw conversion output by using a backend digital logic.Based on the analysis of the output codes,the calibration logic estimates the bit weight of each stage and corrects the outputs.An experimental 14-bit pipelined ADC is fabricated to verify the algorithm.The results show that INL errors drop from 20 LSB to 1.7 LSB,DNL errors drop from 2 LSB to 0.4 LSB,SNDR grows from 57 to 65.7 dB and THD drops from -58 to -81 dB.The linearity of the pipelined ADC is improved significantly.

Estimation of Thermal Imaging System Operating Range Based on Background Radiation

Traditional operating range prediction methods assume that the atmospheric radiances in a target path and a background path are equal. But they are different in a real-world environment. To solve this problem,the influence of atmospheric radiance on operating range prediction is analyzed in this paper. Range estimation model in thermal imaging based on background radiation（ REBR） is proposed. Infrared image radiometric calibration is used to calculate the background radiation of a system entrance pupil. The result shows that,compared with traditional operating range prediction methods,the REBR method is more suitable for the actual atmospheric transmission process and the physical process of infrared imaging.

A fast combination calibration of foreground and background for pipelined ADCs

This paper describes a fast digital calibration scheme for pipelined analog-to-digital converters（ADCs）. The proposed method corrects the nonlinearity caused by finite opamp gain and capacitor mismatch in multiplying digital-to-analog converters（MDACs）.The considered calibration technique takes the advantages of both foreground and background calibration schemes.In this combination calibration algorithm,a novel parallel background calibration with signal-shifted correlation is proposed,and its calibration cycle is very short.The details of this technique are described in the example of a 14-bit 100 Msample/s pipelined ADC.The high convergence speed of this background calibration is achieved by three means.First,a modified 1.5-bit stage is proposed in order to allow the injection of a large pseudo-random dithering without missing code.Second,before correlating the signal,it is shifted according to the input signal so that the correlation error converges quickly.Finally,the front pipeline stages are calibrated simultaneously rather than stage by stage to reduce the calibration tracking constants.Simulation results confirm that the combination calibration has a fast startup process and a short background calibration cycle of 2×2^（21） conversions.

A robust and simple two-mode digital calibration technique for pipelined ADC

This paper presents a two-mode digital calibration technique for pipelined analog-to-digital converters （ADC）.The proposed calibration eliminates the errors of residual difference voltage induced by capacitor mismatch of pseudorandom（PN） sequence injection capacitors at the ADC initialization,while applies digital background calibration to continuously compensate the interstage gain errors in ADC normal operation.The presented technique not only reduces the complexity of analog circuit by eliminating the implementation of PN sequence with accurate amplitude in analog domain,but also improves the performance of digital background calibration by minimizing the sensitivity of calibration accuracy to sub-ADC errors.The use of opamps with low DC gains in normal operation makes the proposed design more compatible with future nanometer CMOS technology.The prototype of a 12-bit 40-MS/s pipelined ADC with the two-mode digital calibration is implemented in 0.18-μm CMOS process.Adopting a simple telescopic opamp with a DC gain of 58-dB in the first stage,the measured SFDR and SNDR within the first Nyquist zone reach 80-dB and 66-dB,respectively.With the calibration,the maximum integral nonlinearity （INL） of the ADC reduces from 4.75-LSB to 0.65-LSB,while the ADC core consumes 82-mW at 3.3-V power supply.

A 1.8 V low-power 14-bit 20 Msps ADC with 11.2 ENOB

This paper describes the design of a 14-bit 20 Msps analog-to-digital converter（ADC）,implemented in 0.18μm CMOS technology,achieving 11.2 effective number of bits at Nyquist rate.An improved SHA-less structure and op-amp sharing technique is adopted to significantly reduce the power.The proposed ADC consumes only 166 mW under 1.8 V supply.A fast background calibration is utilized to ensure the overall ADC linearity.