We study the relationship between energy consumption and economic growth in the case of USA by using an asymmetric ARDL bounds test approach to achieve the actual model. The quarterly data set covers the period of 197...We study the relationship between energy consumption and economic growth in the case of USA by using an asymmetric ARDL bounds test approach to achieve the actual model. The quarterly data set covers the period of 1973:1- 2013:4. The findings indicate that the effect of energy consumption is asymmetric in the long term but not in the short term. In the long run, the effect of negative component of energy consumption on economic growth is small and statistically insignificant. The coefficient of the positive component of energy consumption is found about 0.9 and statistically significant at 1% level. We conclude that energy saving policies such as technological progress and organizational rearrangements may have the dimmer effect for the impact of a negative component of energy consumption and the booster effect for impact of the positive component of energy consumption. Thus, energy saving policy should be tightly followed by the goal of high economic growth.展开更多
A novel test access mechanism （TAM） architecture with multi test-channel （TC） based on IEEE Standard 1500 is proposed instead of the traditional sub-TAM structure. The cost model of an area-time associated test an...A novel test access mechanism （TAM） architecture with multi test-channel （TC） based on IEEE Standard 1500 is proposed instead of the traditional sub-TAM structure. The cost model of an area-time associated test and the corresponding lower bound of system-on-chip （SoC） test time are established based on this TAM architecture. The model provides a more reliable method to control the SoC scheduling and reduces the complexity in related algorithm research. The result based on the area time associated test cost model has been validated using the ITC02 test benchmark.展开更多
The authors consider the uniformly most powerful invariant test of the testing problems (Ⅰ) H 0: μ′Σ -1 μ≥CH 1: μ′Σ -1 μ<C and (Ⅱ) H 00 : β′X′Xβσ 2≥CH 11 : β′X′Xβσ 2<C u...The authors consider the uniformly most powerful invariant test of the testing problems (Ⅰ) H 0: μ′Σ -1 μ≥CH 1: μ′Σ -1 μ<C and (Ⅱ) H 00 : β′X′Xβσ 2≥CH 11 : β′X′Xβσ 2<C under m dimensional normal population N m(μ, Σ) and normal linear model (Y, Xβ, σ 2) respectively. Furthermore, an application of the uniformly most powerful invariant test is given.展开更多
文摘We study the relationship between energy consumption and economic growth in the case of USA by using an asymmetric ARDL bounds test approach to achieve the actual model. The quarterly data set covers the period of 1973:1- 2013:4. The findings indicate that the effect of energy consumption is asymmetric in the long term but not in the short term. In the long run, the effect of negative component of energy consumption on economic growth is small and statistically insignificant. The coefficient of the positive component of energy consumption is found about 0.9 and statistically significant at 1% level. We conclude that energy saving policies such as technological progress and organizational rearrangements may have the dimmer effect for the impact of a negative component of energy consumption and the booster effect for impact of the positive component of energy consumption. Thus, energy saving policy should be tightly followed by the goal of high economic growth.
基金Project supported by the SDC Project of Science and Technology Commission of Shanghai Municipality (Grant No.08706201000)the AM Foundation Project of Science and Technology Commission of Shanghai Municipality (Grant No.08700741000)+1 种基金the Leading Academic Discipline Project of Shanghai Education Commission (Grant No.J50104)the Innovation Foundation Project of Shanghai University
文摘A novel test access mechanism （TAM） architecture with multi test-channel （TC） based on IEEE Standard 1500 is proposed instead of the traditional sub-TAM structure. The cost model of an area-time associated test and the corresponding lower bound of system-on-chip （SoC） test time are established based on this TAM architecture. The model provides a more reliable method to control the SoC scheduling and reduces the complexity in related algorithm research. The result based on the area time associated test cost model has been validated using the ITC02 test benchmark.
文摘The authors consider the uniformly most powerful invariant test of the testing problems (Ⅰ) H 0: μ′Σ -1 μ≥CH 1: μ′Σ -1 μ<C and (Ⅱ) H 00 : β′X′Xβσ 2≥CH 11 : β′X′Xβσ 2<C under m dimensional normal population N m(μ, Σ) and normal linear model (Y, Xβ, σ 2) respectively. Furthermore, an application of the uniformly most powerful invariant test is given.
