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Five modified boundary scan adaptive test generation algorithms 被引量:1
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作者 Niu Chunping Ren Zheping Yao Zongzhong 《Journal of Systems Engineering and Electronics》 SCIE EI CSCD 2006年第4期760-763,768,共5页
To study the diagnostic problem of Wire-OR (W-O) interconnect fault of PCB (Printed Circuit Board), five modified boundary scan adaptive algorithms for interconnect test are put forward. These algorithms apply Glo... To study the diagnostic problem of Wire-OR (W-O) interconnect fault of PCB (Printed Circuit Board), five modified boundary scan adaptive algorithms for interconnect test are put forward. These algorithms apply Global-diagnosis sequence algorithm to replace the equal weight algorithm of primary test, and the test time is shortened without changing the fault diagnostic capability. The descriptions of five modified adaptive test algorithms are presented, and the capability comparison between the modified algorithm and the original algorithm is made to prove the validity of these algorithms. 展开更多
关键词 boundary scan adaptive test interconnect test algorithm.
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嵌入式微处理器的调试技术 被引量:1
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作者 施亮 《科技视界》 2013年第8期42-45,58,共5页
本文先介绍了数码复合机中嵌入式微处理器Quatro4110的JTAG接口标准,其次着重分析了TAP(TEST ACCESS PORT)和BOUNDARY-SCAN架构,最后阐述了引入到数码复合机的Quatro4110嵌入式微处理器的JTAG应用调试技术。
关键词 嵌入式微处理器 JTAG TAP boundaryscan
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