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Radiation effects on scientific CMOS image sensor 被引量:2
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作者 赵元富 刘丽艳 +2 位作者 刘晓会 晋孝峰 李想 《Journal of Semiconductors》 EI CAS CSCD 2015年第11期53-57,共5页
A systemic solution for radiation hardened design is presented. Besides, a series of experiments have been carried out on the samples, and then the photoelectric response characteristic and spectral characteristic bef... A systemic solution for radiation hardened design is presented. Besides, a series of experiments have been carried out on the samples, and then the photoelectric response characteristic and spectral characteristic before and after the experiments have been comprehensively analyzed. The performance of the CMOS image sensor with the radiation hardened design technique realized total-dose resilience up to 300 krad(Si) and resilience to singleevent latch up for LET up to110 Me V cm^2/mg. 展开更多
关键词 cmos image sensoraps dark current dark signal response non-uniformity total dose effects single event effects
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