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Analysis on the Application of Image Processing Technology in Clothing Pattern Recognition 被引量:1
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作者 刘静 庄梅玲 +1 位作者 艾容羽 高婷 《Journal of Donghua University(English Edition)》 EI CAS 2020年第3期224-231,共8页
A clothing pattern is a significant embodiment of regional culture and national characteristics.The recognition of clothing patterns could be realized objectively and accurately by using digital image processing techn... A clothing pattern is a significant embodiment of regional culture and national characteristics.The recognition of clothing patterns could be realized objectively and accurately by using digital image processing technology.The researches on the extraction techniques of various pattern elements were compared and analyzed.Then the researches on clothing pattern color,outline and fabric texture extraction were summarized.And the core technology chain model of clothing pattern extraction was constructed.The research status,the core technology and the development trend of pattern element extraction technology based on two-dimensional images were obtained.What’s more,a reference for the follow-up research of clothing patterns and the technology upgrading of textile and clothing industries were provided. 展开更多
关键词 image filtering color space color clustering edge detection clothing pattern
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Integrated color defect detection method for polysilicon wafers using machine vision 被引量:2
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作者 Zai-Fang Zhang Yuan Liu +1 位作者 Xiao-Song Wu Shu-Lin Kan 《Advances in Manufacturing》 SCIE CAS 2014年第4期318-326,共9页
For the typical color detects of polysilicon wafers, i.e., edge discoloration, color inaccuracy and color non-uniformity, a new integrated machine vision detection method is proposed based on an HSV color model. By tr... For the typical color detects of polysilicon wafers, i.e., edge discoloration, color inaccuracy and color non-uniformity, a new integrated machine vision detection method is proposed based on an HSV color model. By transforming RGB image into three-channel HSV images, the HSV model can efficiently reduce the disturbances of complex wafer textures. A fuzzy color clustering method is used to detect edge discoloration by defining membership function for each channel image. The mean-value classi- fying method and region growing method are used to identify the other two defects, respectively. A vision detection system is developed and applied in the produc- tion of polysilicon wafers. 展开更多
关键词 Polysilicon wafers color defect detection Machine vision Fuzzy color clustering Region growingmethod
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Fast time-division color electroholography using a multiple-graphics processing unit cluster system with a single spatial light modulator 被引量:1
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作者 Hiromitsu Araki Naoki Takada +8 位作者 Shohei Ikawa Hiroaki Niwase Yuki Maeda Masato Fujiwara Hirotaka Nakayama Minoru Oikawa Takashi Kakue Tom oyoshi Shim obaba and Tom oyoshi Ito 《Chinese Optics Letters》 SCIE EI CAS CSCD 2017年第12期34-37,共4页
We demonstrate fast time-division color etectroholography using a multiple-graphics-processing-unit (GPU) cluster system with a spatial light modulator and a controller to switch the color of the reconstructing ligh... We demonstrate fast time-division color etectroholography using a multiple-graphics-processing-unit (GPU) cluster system with a spatial light modulator and a controller to switch the color of the reconstructing light. The controller comprises a universal serial bus module to drive the liquid crystal optical shutters. By using the controller, the computer-generated hologram (CGH) display node of the multiple-GPU cluster system synchronizes the display of the CGH with the color switching of the reconstructing light. Fast time-division color electroholography at 20 fps is realized for a three-dimensional object comprising 21,000 points per color when 13 GPUs are used in a multiple-GPU cluster system. 展开更多
关键词 GPU RGB Fast time-division color electroholography using a multiple-graphics processing unit cluster system with a single spatial light modulator CGH
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